Published December 15, 1983 | Version v1
Journal article

High energy ion microprobes

Creators

  • 1. Heidelberg Univ. (Germany, F.R.). Physiologisches Inst.

Description

Analysis with high energy ion beams can be applied to microscopic samples or substructures of complex specimens by using nuclear or proton microprobes. Focusing of high energy ion beams requires specially designed collimators and lens systems. At present, beam diameters of 1 μm are obtained. The lateral resolution of the instruments, however, is not limited to this 1 μm. Consequently microprobe analysis with ion beams in favourable cases can provide better analytical possibilities and lateral resolution as compared with electron microprobes. Due to aberrations an improvement of beam diameters to less than 0.5-1 μm requires compensation of at least the chromatic aberration. The most important fields of application are mineralogy, materials science and biology. With nuclear reactions and PIXE (particle induced X-ray emission) the whole periodic table can be measured with detection limits down to the ppm level (weight fraction). The virtual lack of beam broadening by scattering in samples of a few μm thickness makes a kind of microscopic chemical tomography possible. (orig.)

Additional details

Publishing Information

Journal Title
Nucl. Instrum. Methods Phys. Res.
Journal Volume
218
Journal Issue
1-3
Series
Nucl. Instrum. Methods Phys. Res.
Journal Page Range
197-202
ISSN
0167-5087

Conference

Title
6. international conference on ion beam analysis (IBA-6).
Dates
23-27 May 1983.
Place
Tempe, AZ (USA).

INIS

Country of Publication
Netherlands
Country of Input or Organization
Netherlands
INIS RN
15047829
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference, Numerical Data
Descriptors DEI
BEAM OPTICS; BIOLOGY; COMPILED DATA; ION MICROPROBE ANALYSIS; LENSES; MINERALOGY; NUCLEAR REACTION ANALYSIS; PIXE ANALYSIS; SPATIAL RESOLUTION; TRACE AMOUNTS; X-RAY SPECTRA
Descriptors DEC
CHEMICAL ANALYSIS; DATA; INFORMATION; MICROANALYSIS; NONDESTRUCTIVE ANALYSIS; NUMERICAL DATA; RESOLUTION; SPECTRA; X-RAY EMISSION ANALYSIS