Study of YBCO thin films deposited by intense pulsed light ion beam evaporation
- 1. Nagaoka Univ. of Technology, Niigata (Japan)
Description
Preparation of thin films of YBCO on MgO (100) by means of intense, pulsed ion beam evaporation is reported. The films have been characterized by X-ray diffraction and electron probe microanalysis. We investigated the dependence of the film composition on target stoichiometry, substrate temperature and number of shots. The study reveals possibility of production of high quality films, c-axis perpendicular on the substrate surface, from 123 YBCO target, 7000C substrate temperature, single shot, vacuum deposited. Multishot depositions create off-stoichiometric films, Cu and Ba depleted, approximately by 43%-67% less than the target content in Cu or Ba. This could be explained as a reevaporation of the lower boiling temperature elements (Cu, Ba), by every new high temperature and energy ablated plume. (author)
Additional details
Publishing Information
- Imprint Title
- New applications of pulsed, high-energy density plasmas
- Imprint Pagination
- 219 p.
- Journal Page Range
- p. 10-17.
- Report number
- NIFS-PROC--23
Conference
- Title
- Symposium on 'new applications of pulsed, high-energy density plasmas'.
- Dates
- 12-13 Dec 1994.
- Place
- Nagoya (Japan).
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 27022279
- Subject category
- S07: ISOTOPES AND RADIATION SOURCES;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BARIUM COMPOUNDS; COPPER COMPOUNDS; ELECTRON MICROPROBE ANALYSIS; HIGH-TC SUPERCONDUCTORS; OXIDES; OXYGEN 16 BEAMS; PHYSICAL VAPOR DEPOSITION; SCANNING ELECTRON MICROSCOPY; STOICHIOMETRY; THIN FILMS; X-RAY DIFFRACTION; YTTRIUM COMPOUNDS
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; BEAMS; CHALCOGENIDES; CHEMICAL ANALYSIS; COHERENT SCATTERING; DEPOSITION; DIFFRACTION; ELECTRON MICROSCOPY; FILMS; ION BEAMS; MICROANALYSIS; MICROSCOPY; NONDESTRUCTIVE ANALYSIS; OXYGEN COMPOUNDS; SCATTERING; SUPERCONDUCTORS; SURFACE COATING; TRANSITION ELEMENT COMPOUNDS