Stop band tuning of three-dimensional photonic crystals through coating of semiconductor materials
Creators
- 1. National Tsing-Hua University, Department of Chemical Engineering (China)
Description
Fine-tuning of stop band positioning, ranging from several nano meters to several tens of nano meters, was achieved through sequential thin layer coating of semiconductor materials onto the constituent particles of a three dimensional silica-based photonic crystal. Several semiconductor materials, including TiO2, CdS, and ZnSe, were successfully used to achieve a controllable red-shift of the stop band position of synthetic opal. The stop band shift observed in the present work can be explained by Bragg's law. The coating operation is equivalent to replacing the lower dielectric constant of the material, i.e. the air around it, with a higher dielectric constant semiconductor materials, thus increasing the effective refractive index of the structure and giving a red-shift in the stop band.
Additional details
Identifiers
Publishing Information
- Journal Title
- Applied Physics. A, Materials Science and Processing (Print)
- Journal Volume
- 79
- Journal Issue
- 7
- Journal Page Range
- p. 1741-1745
- ISSN
- 0947-8396
- CODEN
- APAMFC
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 54062846
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CADMIUM SULFIDES; COATINGS; CRYSTALS; DIELECTRIC MATERIALS; RED SHIFT; REFRACTIVE INDEX; SEMICONDUCTOR MATERIALS; THIN FILMS; THREE-DIMENSIONAL LATTICES; TITANIUM OXIDES; ZINC SELENIDES
- Descriptors DEC
- CADMIUM COMPOUNDS; CHALCOGENIDES; CRYSTAL LATTICES; CRYSTAL STRUCTURE; FILMS; INORGANIC PHOSPHORS; MATERIALS; OPTICAL PROPERTIES; OXIDES; OXYGEN COMPOUNDS; PHOSPHORS; PHYSICAL PROPERTIES; SELENIDES; SELENIUM COMPOUNDS; SULFIDES; SULFUR COMPOUNDS; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; ZINC COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2004 Springer-Verlag
- Notes
- www.springer.de