Published November 1, 2007
| Version v1
Report
Large-scale transient sensitivity analysis of a radiation damaged bipolar junction transistor
Description
Automatic differentiation (AD) is useful in transient sensitivity analysis of a computational simulation of a bipolar junction transistor subject to radiation damage. We used forward-mode AD, implemented in a new Trilinos package called Sacado, to compute analytic derivatives for implicit time integration and forward sensitivity analysis. Sacado addresses element-based simulation codes written in C++ and works well with forward sensitivity analysis as implemented in the Trilinos time-integration package Rythmos. The forward sensitivity calculation is significantly more efficient and robust than finite differencing
Availability note (English)
Available from http://www.springerlink.com/content/l46013388019212g/Additional details
Identifiers
Publishing Information
- Imprint Pagination
- 10 p.
- Report number
- SAND--2007-7767C
Conference
- Title
- 5. International Conference on Automatic Differentiation
- Dates
- 11-15 Aug 2008
- Place
- Bonn (Germany)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 40026378
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference, Non-conventional Literature
- Descriptors DEI
- COMPUTERIZED SIMULATION; DAMAGE; JUNCTION TRANSISTORS; R CODES; RADIATION EFFECTS; S CODES; SENSITIVITY ANALYSIS
- Descriptors DEC
- COMPUTER CODES; SEMICONDUCTOR DEVICES; SIMULATION; TRANSISTORS
Optional Information
- Contract/Grant/Project number
- AC04-94AL85000
- Funding organization
- US Department of Energy (United States)