Published November 1, 2007 | Version v1
Report

Large-scale transient sensitivity analysis of a radiation damaged bipolar junction transistor

Description

Automatic differentiation (AD) is useful in transient sensitivity analysis of a computational simulation of a bipolar junction transistor subject to radiation damage. We used forward-mode AD, implemented in a new Trilinos package called Sacado, to compute analytic derivatives for implicit time integration and forward sensitivity analysis. Sacado addresses element-based simulation codes written in C++ and works well with forward sensitivity analysis as implemented in the Trilinos time-integration package Rythmos. The forward sensitivity calculation is significantly more efficient and robust than finite differencing

Availability note (English)

Available from http://www.springerlink.com/content/l46013388019212g/

Additional details

Publishing Information

Imprint Pagination
10 p.
Report number
SAND--2007-7767C

Conference

Title
5. International Conference on Automatic Differentiation
Dates
11-15 Aug 2008
Place
Bonn (Germany)

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
40026378
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference, Non-conventional Literature
Descriptors DEI
COMPUTERIZED SIMULATION; DAMAGE; JUNCTION TRANSISTORS; R CODES; RADIATION EFFECTS; S CODES; SENSITIVITY ANALYSIS
Descriptors DEC
COMPUTER CODES; SEMICONDUCTOR DEVICES; SIMULATION; TRANSISTORS

Optional Information

Contract/Grant/Project number
AC04-94AL85000
Funding organization
US Department of Energy (United States)