Design of X-ray supermirrors
Description
A new approach is proposed for the design of wide band-pass multilayer optical elements operating in the hard X-ray spectral region. The method, based on the combination of analytical and numerical methods, solves the inverse problem consisting of inferring the composition profile of a depth-graded multilayer coating. The key feature of our approach consists in using an analytical expression for the depth-distribution of the period as initial solution for direct computer calculations. This allows a global minimization of the merit function and a many-fold decrease of the computer run time. Simulations of two particular cases are presented: a constant reflectivity over a wide spectral range and a complicated reflectivity profile. The best choice of material pairs for composing a depth-graded multilayer structure is discussed from the viewpoint of maximum achievable reflectivity and least number of bi-layers. Features of depth-graded multilayer mirrors, which are distinctive from conventional periodic mirrors, are examined. The factors influencing the optical quality of broad-band multilayers are also considered
Additional details
Identifiers
- PII
- S0168900200010792;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 460
- Journal Issue
- 2-3
- Journal Page Range
- p. 424-443
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Germany
- INIS RN
- 34008578
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- COMPUTER CALCULATIONS; DESIGN; HARD X RADIATION; INVERSE SCATTERING PROBLEM; MIRRORS; PHOTON TRANSPORT; REFLECTIVITY; X-RAY EQUIPMENT; X-RAY SPECTRA
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; EQUIPMENT; IONIZING RADIATIONS; NEUTRAL-PARTICLE TRANSPORT; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RADIATION TRANSPORT; RADIATIONS; SPECTRA; SURFACE PROPERTIES; X RADIATION
Optional Information
- Copyright
- Copyright (c) 2001 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.