Published October 15, 1980 | Version v1
Journal article Metadata-only

RAMs: the problem of transient errors due to alpha radiation

Creators

Description

Errors that remained unexplained for a long time have occurred with dynamic random access memories. It has been known since 1978 that they are due to stray alpha radiation. A good understanding of this phenomenon enables its effects to be neutralized and the reliability of the products to be guarantied

Abstract (French)

Des erreurs 'longtemps' inexpliquees se sont produites avec les memoires dynamiques Random Access Memory (memoires a adressage aleatoire). On sait, depuis 1978, qu'elles sont dues au rayonnement alpha parasite. La bonne connaissance de ce phenomene permet d'en neutraliser les effets et de garantir la fiabilite des produits

Additional details

Additional titles

Original title (French)
RAMs: le probleme des erreurs fugitives dues au rayon alpha

Publishing Information

Journal Title
Electron. Ind.
Journal Issue
no.4
Series
Electron. Ind.
ISSN
0013-5259

INIS

Country of Publication
France
Country of Input or Organization
France
INIS RN
12589371
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
ALPHA PARTICLES; PHYSICAL RADIATION EFFECTS; RELIABILITY; SEMICONDUCTOR STORAGE DEVICES
Descriptors DEC
CHARGED PARTICLES; HELIUM IONS; IONS; MEMORY DEVICES; RADIATION EFFECTS; SEMICONDUCTOR DEVICES