Neutral Recycling Effect on Edge ITG Turbulence and Transport
- 1. Princeton Plasma Physics Laboratory (PPPL), Princeton, NJ 08540 (United States)
- 2. Intel Corporation, Santa Clara, CA 95054 (United States)
- 3. Korea Advanced Institute of Science and Technology (KAIST), Daejeon (Korea, Republic of)
Description
Full text: Neutral particle recycling effect on the edge ITG (ion temperature gradient) turbulence has been studied in a realistic tokamak geometry with a steep edge pedestal, using a full-f edge gyrokinetic code XGC1. The ITG turbulence is chosen here because it is the most fundamental and robust form of tokamak plasma instability, with its long radial correlation length influencing other turbulence in the pedestal. It has been found that the charge exchange interaction of the neutral particles with the plasma ions enhance the edge ITG turbulence and transport through a) reduction of the E x B shearing rate and b) through cooling of the ion temperature near the magnetic separatrix, which leads to an enhanced ion temperature gradient in the extended edge region. (author)
Additional details
Identifiers
Publishing Information
- Imprint Title
- 26. IAEA Fusion Energy Conference. Programme, Abstracts and Conference Material
- Imprint Pagination
- 935 p.
- Journal Page Range
- p. 631
- Report number
- IAEA-CN--234
Conference
- Title
- 26. IAEA Fusion Energy Conference
- Acronym
- FEC 2016
- Dates
- 17-22 Oct 2016
- Place
- Kyoto (Japan)
INIS
- Country of Publication
- International Atomic Energy Agency (IAEA)
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 50008502
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CHARGE-EXCHANGE INTERACTIONS; ION TEMPERATURE; NEUTRAL PARTICLES; PLASMA; PLASMA INSTABILITY; TEMPERATURE GRADIENTS; TOKAMAK DEVICES
- Descriptors DEC
- CLOSED PLASMA DEVICES; FUNDAMENTAL INTERACTIONS; INSTABILITY; INTERACTIONS; STRONG INTERACTIONS; THERMONUCLEAR DEVICES
Optional Information
- Notes
- Abstract only
- Secondary number(s)
- IAEA-CN--234-0287