Analysis of capillary optic performance for hard x-rays

A geometrical optics simulation program which includes roughness and waviness effects has been developed to analyze the performance of polycapillary x-ray optics in the energy regime 10--80 keV. The simulation was in excellent agreement with previous experimental results. The calculations showed that low energy x-ray performance is sensitive to roughness while high energy x-ray performance is affected by waviness and profile error (bending). Despite the low critical angle for total external reflection at high energies, capillary x-ray optics appear promising for many hard x-ray applications. Transmission measurements at high energies have also proven to be a very sensitive tool in capillary quality analysis