Nano-scale effects on Young's modulus of nanoimprint polymers measured by photoacoustic metrology
- 1. Catalan Institute of Nanotechnology, Research Centre of Nanoscience and Nanotechnology (ICN-CSIC), Campus de Bellaterra, Edifici CM3, 08193-Bellaterra (Barcelona) (Spain)
- 2. Institute of Mechanical Systems, Department of Mechanical and Process Engineering, ETH Zurich, CH-8092 Zurich (Switzerland)
Description
The ultrashort laser pulse photoacoustic method has been used to characterise the physical properties of spin-coated PMMA layers onto Si wafers with thicknesses from 586 to 13 nm, . Acoustic speeds of polymer films were derived from the measured time of flight of acoustic waves in polymers and from their calculated visco-elastic properties. A 12% increase, in comparison to the PMMA bulk value, of the acoustic speeds was measured for polymer films with thicknesses below 80 nm, which corresponds to an increase in Young's modulus of 26%. In addition, we found that adding a hexamethyldisilazane primer monolayer between the polymer film and the Si substrate lessen the increase in Young's modulus, suggesting that the nanoscale changes are due to interface effects.
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/214/1/012049Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 214
- Journal Issue
- 1
- Journal Page Range
- [5 p.]
- ISSN
- 1742-6596
Conference
- Title
- 15. international conference on photoacoustic and photothermal phenomena
- Acronym
- ICPPP15
- Dates
- 19-23 Jul 2009
- Place
- Leuven (Belgium)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42050983
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COMPARATIVE EVALUATIONS; ELASTICITY; FILMS; INTERFACES; LASER RADIATION; LAYERS; NANOSTRUCTURES; PHOTOACOUSTIC SPECTROSCOPY; PMMA; PULSES; SILICON; SOUND WAVES; SPIN; SUBSTRATES; TIME-OF-FLIGHT METHOD; VELOCITY; YOUNG MODULUS
- Descriptors DEC
- ANGULAR MOMENTUM; ELECTROMAGNETIC RADIATION; ELEMENTS; ESTERS; EVALUATION; MECHANICAL PROPERTIES; ORGANIC COMPOUNDS; ORGANIC POLYMERS; PARTICLE PROPERTIES; POLYACRYLATES; POLYMERS; POLYVINYLS; RADIATIONS; SEMIMETALS; SPECTROSCOPY