Published May 1, 2009 | Version v1
Journal article

Investigation of the magnetic anisotropy of silicide films ion-beam synthesized in the external magnetic field

  • 1. Zavoisky Physical-Technical Institute (ZPhTI), Sibirsky Tract, 10/7, RAS, 420029 Kazan (Russian Federation)
  • 2. Kazan State Technology University, Kazan (Russian Federation)

Description

Magnetic-field-assisted ion-beam synthesis was used to produce thin magnetic films. (1 1 1) Si wafers were implanted with 40 keV Fe+ ions up to the fluence of 3 x 1017 cm-2 in the external magnetic field of 4 x 103-16 x 103 A/m. The samples were investigated by Moessbauer spectroscopy, X-ray diffraction and autodyne method. The obtained thin films consisted of ferromagnetic Fe3Si and nonmagnetic FeSi phases. The application of the magnetic field during the implantation led to the pronounced in-plane magnetic anisotropy of the synthesized films. On the basis of the Stoner-Wohlfarth model it was shown that the observed anisotropy is the result of the superposition of magnetocrystalline and induced uniaxial anisotropies.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nimb.2009.01.111

Additional details

Identifiers

DOI
10.1016/j.nimb.2009.01.111;
PII
S0168-583X(09)00145-1;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
267
Journal Issue
8-9
Journal Page Range
p. 1600-1603
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
16. international conference on ion beam modification of materials
Dates
31 Aug - 5 Sep 2008
Place
Dresden (Germany)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41029224
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ANISOTROPY; ION BEAMS; IRON IONS; IRON SILICIDES; KEV RANGE 10-100; MAGNETIC FIELDS; MOESSBAUER EFFECT; SYNTHESIS; THIN FILMS; X-RAY DIFFRACTION
Descriptors DEC
BEAMS; CHARGED PARTICLES; COHERENT SCATTERING; DIFFRACTION; ENERGY RANGE; FILMS; IONS; IRON COMPOUNDS; KEV RANGE; SCATTERING; SILICIDES; SILICON COMPOUNDS; TRANSITION ELEMENT COMPOUNDS

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.