The new edge-TCT setup at the University of Hamburg

The purpose of the edge Transient Current Technique (TCT) is to measure the drift velocity, electric field and charge collection in radiation-damaged silicon strip sensors. A new edge-TCT setup was developed in our laboratory. In edge-TCT measurements, infrared light from a sub-ns pulsed laser is focused to a μm-size spot and scanned across the polished edge of a strip sensor. Thus electron-hole pairs are generated at a known depth in the sensor. Electrons and holes drift in the electric field and induce transient currents in the sensor electrodes. The transient currents are recorded as a function of the applied voltage and the position of the laser focus, and analyzed in order to determine the drift velocities, the electric field and the charge collection. In this talk, the setup and procedures for preparation of the sensor and calibration are described, and results of first measurements on non-irradiated silicon strip sensors are presented.