The influence of hopping on modulated photoconductivity
Creators
- 1. Laboratoire de Genie Electrique de Paris, (UMR 8507 CNRS), Supelec, Universites Paris VI et XI, 11 rue Joliot Curie, Plateau de Moulon, 91190 Gif sur Yvette (France)
- 2. Laboratory of Semiconductor and Metal Materials, Faculty of Science and Engineering, University Mohammed Khider, PO Box 145, Biskra 07000 (Algeria)
Description
We have developed equations taking into account both multiple-trapping and hopping processes for describing transport phenomena in disordered semiconductors. These equations have been introduced into a numerical simulation to model the steady state dark conductivity and photoconductivity as well as the modulated photoconductivity. The influence of parameters such as the density of states and attempt-to-hop frequency on the results of these experiments has been investigated. Steady state and modulated photoconductivity experiments have been performed on a hydrogenated amorphous silicon film in the temperature range 18-300 K and the results have been compared with those from the numerical simulation. This comparison shows that the latter provides a suitable interpretation of the experimental behaviours observed in both experiments.
Availability note (English)
Available from http://dx.doi.org/10.1088/0953-8984/21/4/045508Additional details
Identifiers
- DOI
- 10.1088/0953-8984/21/4/045508;
- PII
- S0953-8984(09)87882-X;
Publishing Information
- Journal Title
- Journal of Physics. Condensed Matter
- Journal Volume
- 21
- Journal Issue
- 4
- Journal Page Range
- [12 p.]
- ISSN
- 0953-8984
- CODEN
- JCOMEL
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41032430
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- AMORPHOUS STATE; CARRIER MOBILITY; COMPARATIVE EVALUATIONS; EQUATIONS; FILMS; PHOTOCONDUCTIVITY; SEMICONDUCTOR MATERIALS; SILICON; SIMULATION; STEADY-STATE CONDITIONS; TEMPERATURE RANGE; TEMPERATURE RANGE 0013-0065 K; TEMPERATURE RANGE 0065-0273 K; TRAPPING
- Descriptors DEC
- ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; ELEMENTS; EVALUATION; MATERIALS; MOBILITY; PHYSICAL PROPERTIES; SEMIMETALS; TEMPERATURE RANGE