The impact of silicon mass on the radiolysis process occurring under the influence of γ-quanta on nano-Si/H2O suspension system
Creators
- 1. Scientific - Research Institute of Space Informatics, Baku (Azerbaijan)
Description
The amount, formation rate, and radiation-chemical yield of molecular hydrogen, obtained from water radiolysis process within the system under the influence of γ-quanta (60Co, P=22 rad/sec, T=300K), have been defined by maintaining the water volume constant (V=6 ml) and by changing the silica mass (mSi=0.0 (pure water), 0.0025, 0.005, 0.01, 0.015 0.02, 0.03, 0.04, 0.06, 0.12 g) in nano-Si/H2O system with d=50 nm particle size. It was found that the amount, formation rate and radiation-chemical yield of molecular hydrogen, defined according to the overall system from radiation-heterogeneous transformation of water, increase directly proportional to the silica mass in the mSi≤0.02 g values of nano-silicon mass added to the water, but in mSi>0,02 g values, the inclination angle decreases. The formation rate and radiation-chemical yield of molecular hydrogen, defined according to nano-silica, do not change at mSi≤0.02 g, but there is observed a decrease at mSi>0.02 g. The maximum radiation-chemical yield of molecular hydrogen, determined according to the overall system, got the value of 10.9; but according to the nano-silicon, the value of 1788 molecules/100 eV.
Additional details
Publishing Information
- Journal Title
- Journal of Radiation Researches
- Journal Volume
- 6
- Journal Issue
- 2
- Journal Page Range
- p. 89-96
- ISSN
- 2312-3001
INIS
- Country of Publication
- Azerbaijan
- Country of Input or Organization
- Azerbaijan
- INIS RN
- 52007147
- Subject category
- S38: RADIATION CHEMISTRY, RADIOCHEMISTRY AND NUCLEAR CHEMISTRY;
- Descriptors DEI
- CHEMICAL RADIATION EFFECTS; COMPTON EFFECT; RADIOLYSIS
- Descriptors DEC
- CHEMICAL RADIATION EFFECTS; CHEMICAL REACTIONS; DECOMPOSITION; ELASTIC SCATTERING; ELECTROMAGNETIC INTERACTIONS; FUNDAMENTAL INTERACTIONS; INTERACTIONS; RADIATION EFFECTS; SCATTERING
Optional Information
- Notes
- 1 pic.; 1 tab.; 30 refs.