Electrical resistivity, oxidation resistivity and hardness of single crystal compounds in the Er-Rh-B system
- 1. Tohoku Univ., Sendai (Japan). Inst. for Materials Research
- 2. Dept. of Applied Chemistry, Kanagawa Univ., Yokohama (Japan)
- 3. Dept. of Civil Engineering, Faculty of Engineering, Kokushikan Univ., Tokyo (Japan)
- 4. National Research Institute for Metals, 1-2-1 Sengen, Tsukuba-shi 305 (Japan)
- 5. Mineralogical Institute, Faculty of Science, The University of Tokyo, 7-3-1, Hongo, Bunkyo-ku, Tokyo 113 (Japan)
Description
Single crystals of ternary borides ErRh3B (cubic,Pm3m), ErRh3B2 (monoclinic, C2/m) and ErRh4B4 (tetragonal, P42/nmc) have been grown from copper solution by slow cooling method. The electrical resistivity, oxidation resistivity and Vickers microhardness were studied. The electrical resistivities at room temperature of the (100) face of ErRh3B, (001) face of ErRh3B2 and (100) face of ErRh4B4 are 25.6 μΩ.cm, 50.0 μΩ.cm and 106.8 μΩ.cm, respectively. According to thermogravimetric and differential thermal analyses, the oxidation of ErRh3B, ErRh3B2 and ErRh4B4 start at 1030 C, 373 C and 690 C, respectively. The weight gain of the same compounds after heating in air up to 1200 C is 0.7%, 15.44% and 5.4%, respectively. The values of the Vickers microhardness for the (100) face of ErRh3B, the (100) face of ErRh3B2 and the (110) face of ErRh4B4 are 4.8-5.0 GPa, 10.4-10.9 GPa and 10.9-11.3 GPa, respectively. The effect of boron content and crystal structure of each compound on the electrical resistivity, oxidation resistivity and Vickers microhardness are discussed. (orig.)
Additional details
Publishing Information
- Journal Title
- Journal of Alloys and Compounds
- Journal Volume
- 280
- Journal Issue
- 1-2
- Journal Page Range
- p. 65-70
- ISSN
- 0925-8388
- CODEN
- JALCEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Switzerland
- INIS RN
- 30000928
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CRYSTAL GROWTH; CRYSTAL STRUCTURE; ELECTRIC CONDUCTIVITY; ERBIUM COMPOUNDS; MICROHARDNESS; OXIDATION; PHASE DIAGRAMS; RHODIUM COMPOUNDS; SCANNING ELECTRON MICROSCOPY; SOLUTIONS; THERMAL ANALYSIS
- Descriptors DEC
- CHEMICAL REACTIONS; DIAGRAMS; DISPERSIONS; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; HARDNESS; HOMOGENEOUS MIXTURES; INFORMATION; MECHANICAL PROPERTIES; MICROSCOPY; MIXTURES; PHYSICAL PROPERTIES; RARE EARTH COMPOUNDS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Notes
- 16 refs.