Published March 24, 2003 | Version v1
Journal article

Epitaxial growth of CoSi2 on hydrogen-terminated Si(001)

  • 1. Kochi University of Technology, Tosa-Yamada, Kochi 782-8502 (Japan)
  • 2. Institute of Space and Astronautical Science, 3-1-1 Yoshinodai, Sagamihara, Kanagawa 229-8510 (Japan)
  • 3. Silicon Systems Research Laboratories, NEC Corporation, 1120 Shimokuzawa, Sagamihara, Kanagawa 229-1198 (Japan)
  • 4. Teikyo University of Science and Technology, 2525 Yatsusawa, Uenohara-machi, Kitatsauru-gun, Yamanashi 409-0193 (Japan)

Description

We demonstrate that CoSi2 grows epitaxially on H-terminated Si(001) and present the growth mechanism. It was found that direct reaction of Co with Si is suppressed on H-terminated Si below 400 deg. C. Thus, the hydrogen at the Co/Si interface hinders the formation of Co2Si and CoSi. Upon thermal desorption of hydrogen at around 400-550 deg. C, CoSi2, which is closely lattice-matched to Si(001), grows on Si(001) and thus, thin epitaxial CoSi2 films are formed on Si(001). The {111}-faceting was completely suppressed in the epitaxial CoSi2/Si(001), leading to the atomically flat interface

Additional details

Identifiers

Publishing Information

Journal Title
Applied Physics Letters
Journal Volume
82
Journal Issue
12
Journal Page Range
p. 1842-1844
ISSN
0003-6951
CODEN
APPLAB

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
35032388
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Numerical Data
Descriptors DEI
COBALT SILICIDES; CRYSTAL STRUCTURE; EXPERIMENTAL DATA; HYDROGEN; INTERFACES; MOLECULAR BEAM EPITAXY; SILICON; THIN FILMS
Descriptors DEC
COBALT COMPOUNDS; CRYSTAL GROWTH METHODS; DATA; ELEMENTS; EPITAXY; FILMS; INFORMATION; NONMETALS; NUMERICAL DATA; SEMIMETALS; SILICIDES; SILICON COMPOUNDS; TRANSITION ELEMENT COMPOUNDS

Optional Information

Notes
(c) 2003 American Institute of Physics.