Published June 2005 | Version v1
Journal article

Ion yield spectroscopy of sodium following K-shell photoexcitation

  • 1. Harima Institute, RIKEN, The Institute of Physical and Chemical Research, Mikazuki, Sayo, Hyogo 679-5148 (Japan)
  • 2. Rikkyo University, Toshima, Tokyo 171-0021 (Japan)
  • 3. Japan Synchrotron Radiation Research Institute (JASRI), Mikazuki, Sayo, Hyogo 679-5198 (Japan)
  • 4. Kyoto Institute of Technology, Sakyo, Kyoto 606-8585 (Japan)
  • 5. Kansai Gaidai University, Hirakata, Osaka 573-1001 (Japan)

Description

Photoion yields of sodium have been measured following K-shell excitation by time-of-flight (TOF) technique with a high-resolution incident photon energy. For comparison, we also measured single- and double-excitation spectra for Ne in the K-shell excitation region. The incident energy dependence of Na ion TOF spectra shows that in the 1s single-excitation (1s-1np) region below the K-edge (1079 eV), the Na2+ yield is dominant and the fraction of Na+ is much smaller. This is very different when compared with the results of neon single-excitation. Above the K-edge, Na2+ yield decreases and Na3+ yield increases

Additional details

Identifiers

DOI
10.1016/j.elspec.2005.01.093;
PII
S0368-2048(05)00099-X;

Publishing Information

Journal Title
Journal of Electron Spectroscopy and Related Phenomena
Journal Volume
144-147
Journal Page Range
p. 75-78
ISSN
0368-2048
CODEN
JESRAW

Conference

Title
14. international conference on vacuum ultraviolet radiation physics
Acronym
VUV 14
Dates
19-23 Jul 2004
Place
Cairns (Australia)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37039703
Subject category
S74: ATOMIC AND MOLECULAR PHYSICS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
COMPARATIVE EVALUATIONS; DECAY; ENERGY DEPENDENCE; EV RANGE; EXCITATION; ION SPECTROSCOPY; IONIZATION; K SHELL; NEON; PHOTONS; RESOLUTION; SODIUM; SODIUM IONS; TIME-OF-FLIGHT METHOD; YIELDS
Descriptors DEC
ALKALI METALS; BOSONS; CHARGED PARTICLES; ELECTRONIC STRUCTURE; ELEMENTARY PARTICLES; ELEMENTS; ENERGY RANGE; ENERGY-LEVEL TRANSITIONS; EVALUATION; FLUIDS; GASES; IONS; MASSLESS PARTICLES; METALS; NONMETALS; RARE GASES; SPECTROSCOPY

Optional Information

Copyright
Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.