Published April 1, 2021 | Version v1
Journal article

Formation of high-photoresponsivity BaSi2 films on glass substrate by radio-frequency sputtering for solar cell applications

  • 1. Institute of Applied Physics, University of Tsukuba, Tsukuba, Ibaraki 305-8573 (Japan)
  • 2. Tosoh Corporation, Advanced Materials Research Laboratory, Ayase, Kanagawa 252-1123 (Japan)

Description

The formation of high-photoresponsivity semiconducting films composed of earth-abundant elements on a SiO2 substrate is of particular importance for large-scale deployment of solar cells. We investigated the deposition of high-photoresponsivity BaSi2 films by radio-frequency sputtering on indium-tin-oxide (ITO), Ti, or TiN electrodes formed on a SiO2 substrate. Raman spectroscopy and x-ray diffraction measurements revealed the formation of randomly oriented polycrystalline BaSi2 films only on TiN/SiO2 substrates at 570 °C–650 °C. In contrast, impurity phases such as Ba oxides and TiSi2 were included when ITO and Ti layers were used, respectively. The photoresponsivity of the BaSi2 films on TiN electrodes reached 1.1 A W−1 at a wavelength of 790 nm under a bias voltage of 0.5 V applied between the front ITO and bottom TiN electrodes. This value is equivalent to the highest photoresponsivity ever achieved for BaSi2 epitaxial films on Si(111) substrates by molecular beam epitaxy. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1361-6463/abd434

Additional details

Identifiers

Publishing Information

Journal Title
Journal of Physics. D, Applied Physics
Journal Volume
54
Journal Issue
13
Journal Page Range
[6 p.]
ISSN
0022-3727
CODEN
JPAPBE