Cleaning method for improving laser induced damage threshold of multilayer dielectric pulse compressor gratings
Creators
- 1. National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei (China)
Description
Oxygen plasma and HPM solution (mixtures of hydrochloric acid, hydrogen peroxide, and deionized water) were applied to cleaning the multilayer dielectric (MLD) pulse compressor gratings. X-ray photoelectron spectroscopy was carried out to evaluate surface cleanliness of the gratings. It is found that photoresist and fluorocarbon residues can be efficiently removed with oxygen-plasma cleaning and metal contaminants can be completely removed with HPM cleaning. After cleaning processes, the typical diffraction efficiencies in -1st reflected order are maintained larger than 95.0% at an incidence of 66.4° in TE polarization, and the laser induced damage threshold (LIDT) for 10-ps laser pulse at 1053 nm is greatly improved to 1.6 J/cm2. The cleaning method using oxygen plasma and HPM solution can efficiently make the surface clean and therefore enhance the LIDT of MLD gratings. (authors)
Additional details
Publishing Information
- Journal Title
- High Power Laser and Particle Beams
- Journal Volume
- 24
- Journal Issue
- 11
- Journal Page Range
- p. 2631-2636
- ISSN
- 1001-4322
INIS
- Country of Publication
- China
- Country of Input or Organization
- China
- INIS RN
- 45093584
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Descriptors DEI
- CLEANING; DAMAGE; DIELECTRIC MATERIALS; DIFFRACTION; EFFICIENCY; GRATINGS; HYDROCHLORIC ACID; HYDROGEN PEROXIDE; LASER RADIATION; OXYGEN; PLASMA; POLARIZATION; PULSES; RESIDUES; SOLUTIONS; SURFACES; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CHLORINE COMPOUNDS; COHERENT SCATTERING; DISPERSIONS; ELECTROMAGNETIC RADIATION; ELECTRON SPECTROSCOPY; ELEMENTS; HALOGEN COMPOUNDS; HOMOGENEOUS MIXTURES; HYDROGEN COMPOUNDS; INORGANIC ACIDS; INORGANIC COMPOUNDS; MATERIALS; MIXTURES; NONMETALS; OXYGEN COMPOUNDS; PEROXIDES; PHOTOELECTRON SPECTROSCOPY; RADIATIONS; SCATTERING; SPECTROSCOPY
Optional Information
- Notes
- 9 figs., 17 refs.