The influence of Cr and Y on the micro structural evolution of Mg-Cr-O and Mg-Y-O thin films
- 1. Electron Microscopy for Materials Research (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerpen (Belgium)
- 2. PLASMANT Research Group, Department of Chemistry, University of Antwerp, Universiteitsplein 1, 2610 Antwerpen (Belgium)
- 3. Department of Solid State Sciences, Ghent University, Krijgslaan 281/S1, 9000 Ghent (Belgium)
Description
The compositional influence of Cr and Y on the microstructure of Mg-Cr-O, and Mg-Y-O films synthesized by reactive magnetron sputtering has been investigated by transmission electron microscopy, X-ray diffraction and molecular dynamics simulations. A decrease in crystallinity is observed in these films as the M (Cr or Y) content is increased. It is found that M forms a solid solution with MgO for metal ratios up to ∼ 70% and ∼ 50% for Cr and Y respectively. Above ∼ 70% Cr metal ratio the Mg-Cr-O films are found to be completely amorphous. The Mg-Y-O films are composed of Mg(Y)O and Y2O3 nano crystallites, up to ∼ 50% Y metal ratio. Above this ratio, only Y2O3 nano crystallites are found. The preferential < 111> MgO grain alignment is strongly affected by the increase in M content. For M metal ratios up to ∼ 50%, there is a selective promotion of the < 100> MgO grain alignments and a decline in the < 111> grain alignments.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2011.02.050Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2011.02.050;
- PII
- S0040-6090(11)00567-0;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 519
- Journal Issue
- 16
- Journal Page Range
- p. 5388-5396
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43051893
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALIGNMENT; MAGNESIUM OXIDES; MAGNETRONS; METALS; MICROSTRUCTURE; MOLECULAR DYNAMICS METHOD; SIMULATION; SOLID SOLUTIONS; SPUTTERING; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION; YTTRIUM OXIDES
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; CALCULATION METHODS; CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; DISPERSIONS; ELECTRON MICROSCOPY; ELECTRON TUBES; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; FILMS; HOMOGENEOUS MIXTURES; MAGNESIUM COMPOUNDS; MICROSCOPY; MICROWAVE EQUIPMENT; MICROWAVE TUBES; MIXTURES; OXIDES; OXYGEN COMPOUNDS; SCATTERING; SOLUTIONS; TRANSITION ELEMENT COMPOUNDS; YTTRIUM COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.