Published June 1, 2011 | Version v1
Journal article

The influence of Cr and Y on the micro structural evolution of Mg-Cr-O and Mg-Y-O thin films

  • 1. Electron Microscopy for Materials Research (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerpen (Belgium)
  • 2. PLASMANT Research Group, Department of Chemistry, University of Antwerp, Universiteitsplein 1, 2610 Antwerpen (Belgium)
  • 3. Department of Solid State Sciences, Ghent University, Krijgslaan 281/S1, 9000 Ghent (Belgium)

Description

The compositional influence of Cr and Y on the microstructure of Mg-Cr-O, and Mg-Y-O films synthesized by reactive magnetron sputtering has been investigated by transmission electron microscopy, X-ray diffraction and molecular dynamics simulations. A decrease in crystallinity is observed in these films as the M (Cr or Y) content is increased. It is found that M forms a solid solution with MgO for metal ratios up to ∼ 70% and ∼ 50% for Cr and Y respectively. Above ∼ 70% Cr metal ratio the Mg-Cr-O films are found to be completely amorphous. The Mg-Y-O films are composed of Mg(Y)O and Y2O3 nano crystallites, up to ∼ 50% Y metal ratio. Above this ratio, only Y2O3 nano crystallites are found. The preferential < 111> MgO grain alignment is strongly affected by the increase in M content. For M metal ratios up to ∼ 50%, there is a selective promotion of the < 100> MgO grain alignments and a decline in the < 111> grain alignments.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2011.02.050

Additional details

Identifiers

DOI
10.1016/j.tsf.2011.02.050;
PII
S0040-6090(11)00567-0;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
519
Journal Issue
16
Journal Page Range
p. 5388-5396
ISSN
0040-6090
CODEN
THSFAP

Optional Information

Copyright
Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.