Published November 1985 | Version v1
Journal article Metadata-only

X-ray photoelectron valence band spectra from semiconductors Bi2Te3 and Sb2Te3

Creators

  • 1. Martin-Luther-Universitaet Halle-Wittenberg, Halle (German Democratic Republic). Sektion Physik

Description

Angular resolved X-ray photoelectron spectra (ARXPS) are measured for valence bands of the layer semiconductors Bi2Te3 and Sb2Te3. Starting from simple models taking into consideration the atomic construction, photoionization cross sections and the crystal structure the spectra can be interpreted. Important conclusions are drawn on the electronic structure of these semiconducting compounds. (author)

Additional details

Publishing Information

Journal Title
Cryst. Res. Technol.
Journal Volume
20
Journal Issue
11
Series
Cryst. Res. Technol.
Journal Page Range
1475-1479
ISSN
0232-1300
CODEN
CRTED

INIS

Country of Publication
Germany
Country of Input or Organization
German Democratic Republic
INIS RN
17035185
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ANGULAR DISTRIBUTION; ANTIMONY TELLURIDES; BAND THEORY; BINDING ENERGY; BISMUTH TELLURIDES; ELECTRONIC STRUCTURE; PHOTOELECTRON SPECTROSCOPY; SEMICONDUCTOR MATERIALS; X-RAY SPECTRA
Descriptors DEC
ANTIMONY COMPOUNDS; BISMUTH COMPOUNDS; CHALCOGENIDES; DISTRIBUTION; ELECTRON SPECTROSCOPY; ENERGY; MATERIALS; SPECTRA; SPECTROSCOPY; TELLURIDES; TELLURIUM COMPOUNDS