Published July 1996
| Version v1
Journal article
Low energy ion scattering and scanning tunneling microscopy for surface structure analysis
Creators
- 1. FB Physik, Universitaet Osnabrueck, D-49069 Osnabrueck (Germany)
Description
Low energy ion scattering (ISS) and scanning tunneling microscopy (STM) are powerful tools for the analysis of surface structures. Both techniques are operative in real space. The ion scattering techniques afford quantitative data on surface structure but as spatial averages only. STM provides non-averaged local information but it is not necessarily quantitative. STM provides detailed information on surface defects, e.g. steps, and mesoscopic structures. The two techniques will be compared in the case of (110) surfaces of Au and Pb. copyright 1996 American Institute of Physics
Additional details
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 378
- Journal Issue
- 1
- Journal Page Range
- p. 8-19.
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- Surfaces, vacuum and their applications.
- Dates
- 19-23 Sep 1994.
- Place
- Cancun (Mexico).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 28040317
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S74: ATOMIC AND MOLECULAR PHYSICS; S74: ATOMIC AND MOLECULAR PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANGULAR DISTRIBUTION; CRYSTAL DEFECTS; ELASTIC SCATTERING; ENERGY SPECTRA; GOLD; ION-ATOM COLLISIONS; LEAD; OPTICAL MICROSCOPY; SURFACES; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE 0273-0400 K; TEMPERATURE RANGE 0400-1000 K
- Descriptors DEC
- ATOM COLLISIONS; COLLISIONS; CRYSTAL STRUCTURE; DISTRIBUTION; ELEMENTS; ION COLLISIONS; METALS; MICROSCOPY; SCATTERING; SPECTRA; TEMPERATURE RANGE; TRANSITION ELEMENTS
Optional Information
- Secondary number(s)
- CONF-9409431--.