Published April 1, 1993 | Version v1
Journal article Metadata-only

A method for the accurate determination of crystal truncation rod intensities by X-ray diffraction

Creators

  • 1. Metals and Ceramics Div., Oak Ridge National Lab., TN (United States)

Description

A method is described for determining the structure factor F(Q) at a scattering vector Q along a crystal truncation rod (CTR) by measuring the total power diffracted with the crystal fixed. (orig.)

Additional details

Publishing Information

Journal Title
Journal of Applied Crystallography
Journal Volume
26
Journal Issue
2
Journal Page Range
p. 166-171.
ISSN
0021-8898
CODEN
JACGAR

INIS

Country of Publication
Denmark
Country of Input or Organization
Denmark
INIS RN
24075597
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
CRYSTAL STRUCTURE; RODS; STRUCTURE FACTORS; X-RAY DIFFRACTION
Descriptors DEC
COHERENT SCATTERING; DIFFRACTION; SCATTERING