Determination of the incommensurate modulated structure of Bi2Sr1.6La0.4CuO6+δ by aberration-corrected transmission electron microscopy
- 1. Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190 (China)
- 2. Beijing National Center for Electron Microscopy, Tsinghua University, Beijing 100084 (China)
Description
The incommensurate modulated structure (IMS) of Bi2Sr1.6La0.4CuO6+δ (BSLCO) has been studied by aberration-corrected transmission electron microscopy in combination with a high-dimensional (HD) space description. Two images are deconvoluted in the negative Cs imaging (NCSI) and positive Cs imaging (PCSI) modes. Similar results for the IMS have been obtained from two corresponding projected potential maps (PPMs), and the size of the dots representing atoms in the NCSI PPM is found to be smaller than that in the PCSI PPM. Considering that the object size is one of the factors that influence the precision of the structural determination, modulation functions for all unoverlapped atoms in BSLCO were determined on the basis of the NCSI PPM in combination with the HD space description. - Highlights: • Dots representing atoms in NCSI is found to be smaller than that in PCSI especially for heavy atoms. • Modulation functions of incommensurate modulated structure in Bi2Sr1.6La0.4CuO6+δ has been determined by using a NCSI image.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.ultramic.2015.08.004Additional details
Identifiers
- DOI
- 10.1016/j.ultramic.2015.08.004;
- arXiv
- arXiv:1209.1160v1;
- PII
- S0304-3991(15)30022-X;
Publishing Information
- Journal Title
- Ultramicroscopy (Amsterdam)
- Journal Volume
- 159
- Journal Issue
- Part 1
- Journal Page Range
- p. 67-72
- ISSN
- 0304-3991
- CODEN
- ULTRD6
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48018097
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ACCURACY; ATOMS; IMAGES; MAPS; MODULATION; POTENTIALS; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- ELECTRON MICROSCOPY; MICROSCOPY
Optional Information
- Copyright
- Copyright (c) 2015 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.