Published December 2015 | Version v1
Journal article

Determination of the incommensurate modulated structure of Bi2Sr1.6La0.4CuO6+δ by aberration-corrected transmission electron microscopy

  • 1. Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190 (China)
  • 2. Beijing National Center for Electron Microscopy, Tsinghua University, Beijing 100084 (China)

Description

The incommensurate modulated structure (IMS) of Bi2Sr1.6La0.4CuO6+δ (BSLCO) has been studied by aberration-corrected transmission electron microscopy in combination with a high-dimensional (HD) space description. Two images are deconvoluted in the negative Cs imaging (NCSI) and positive Cs imaging (PCSI) modes. Similar results for the IMS have been obtained from two corresponding projected potential maps (PPMs), and the size of the dots representing atoms in the NCSI PPM is found to be smaller than that in the PCSI PPM. Considering that the object size is one of the factors that influence the precision of the structural determination, modulation functions for all unoverlapped atoms in BSLCO were determined on the basis of the NCSI PPM in combination with the HD space description. - Highlights: • Dots representing atoms in NCSI is found to be smaller than that in PCSI especially for heavy atoms. • Modulation functions of incommensurate modulated structure in Bi2Sr1.6La0.4CuO6+δ has been determined by using a NCSI image.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.ultramic.2015.08.004

Additional details

Identifiers

DOI
10.1016/j.ultramic.2015.08.004;
arXiv
arXiv:1209.1160v1;
PII
S0304-3991(15)30022-X;

Publishing Information

Journal Title
Ultramicroscopy (Amsterdam)
Journal Volume
159
Journal Issue
Part 1
Journal Page Range
p. 67-72
ISSN
0304-3991
CODEN
ULTRD6

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
48018097
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ACCURACY; ATOMS; IMAGES; MAPS; MODULATION; POTENTIALS; TRANSMISSION ELECTRON MICROSCOPY
Descriptors DEC
ELECTRON MICROSCOPY; MICROSCOPY

Optional Information

Copyright
Copyright (c) 2015 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.