Published July 1, 2007 | Version v1
Miscellaneous

Measuring and Analyzing Transverse Low-Energy Ion Beam Emittances

  • 1. Oak Ridge National Laboratory, TN (United States)

Description

The transverse emittance of an ion beam describes its transverse size as the particles are transported from a source to a target. It allows for predicting beam losses in limiting apertures and the beam focus size at the target. Various definitions and issues are discussed. The most common and emerging measuring techniques are presented, including their advantages. Several methods of emittance data analysis, their accuracy and trustworthiness, are discussed.

Availability note (English)

Available from Oak Ridge National Laboratory, Oak Ridge, TN (US)

Additional details

Publishing Information

Imprint Pagination
5 p.

Conference

Title
17. International Workshop on ECR Ion Sources and Their Applications
Dates
17-21 Sep 2006
Place
Lanzhou (China)

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
41029750
Subject category
S43: PARTICLE ACCELERATORS;
Resource subtype / Literary indicator
Conference, Non-conventional Literature
Descriptors DEI
BEAM DYNAMICS; BEAM EMITTANCE; DATA ANALYSIS; ION BEAMS; MEASURING METHODS
Descriptors DEC
BEAMS; DYNAMICS; MECHANICS

Optional Information

Contract/Grant/Project number
KC0402010; ERKCSNR; AC05-00OR22725
Notes
182-186
Funding organization
SC USDOE - Office of Science (United States)