Effect of hydrogen on high resistivity p-type CdTe
- 1. Centre de Recherches Nucleaires (IN2P3), Lab. Phase, 67 - Strasbourg (France)
Description
Annealing under hydrogen atmosphere has been investigated to define the optimal temperature and duration of this treatment on high resistivity THM grown p-type CdTe. A treatment around 100-150deg C for several hours improves the characteristics of nuclear radiation detectors. The effects of this treatment on polarization, which appear in halogen compensated material with aluminium contacts, has been evaluated. This annealing treatment has been compared to other techniques used to introduce hydrogen by ion implantation at low and high energy. The physical effects of hydrogen introduction have been investigated by current-voltage (I-V) and thermally stimulated current measurements (TSC), as well as by nuclear techniques giving mobility and lifetime products (μτ), rise time distribution and trapping effects. Thermal treatments of CdTe under different atmospheres such as air, argon and vacuum were compared with annealing under hydrogen, in order to understand the effect of molecular hydrogen on CdTe. (orig.)
Additional details
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A
- Journal Volume
- 322
- Journal Issue
- 3
- Journal Page Range
- p. 381-386.
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- 7. international workshop on room temperature semiconductor X- and gamma-ray detectors and associated electronics.
- Dates
- 23-28 Sep 1991.
- Place
- Ravello (Italy).
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 24036139
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANNEALING; CADMIUM TELLURIDES; CARRIER LIFETIME; CARRIER MOBILITY; CDTE SEMICONDUCTOR DETECTORS; CRYSTAL DEFECTS; ELECTRIC CONDUCTIVITY; ELECTRIC CONTACTS; HYDROGEN; OPTIMIZATION; P-TYPE CONDUCTORS; POLARIZATION; PULSE RISE TIME; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE 0273-0400 K; TEMPERATURE RANGE 0400-1000 K; TRAPPING
- Descriptors DEC
- CADMIUM COMPOUNDS; CHALCOGENIDES; CRYSTAL STRUCTURE; ELECTRICAL EQUIPMENT; ELECTRICAL PROPERTIES; ELEMENTS; EQUIPMENT; HEAT TREATMENTS; LIFETIME; MATERIALS; MEASURING INSTRUMENTS; MOBILITY; NONMETALS; PHYSICAL PROPERTIES; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SEMICONDUCTOR MATERIALS; TELLURIDES; TELLURIUM COMPOUNDS; TEMPERATURE RANGE; TIMING PROPERTIES