Published 1975 | Version v1
Book

Implications of cluster model of neutron effects in silicon

  • 1. Intelcom Rad Tech, San Diego, Calif. (USA)

Description

no abstract available

Additional details

Publishing Information

Publisher
Institute of Physics.
Imprint Place
London
ISBN
0854981136
Imprint Title
Lattice defects in semiconductors, 1974. Invited and contributed papers from the international conference on lattice defects in semiconductors held in Freiburg, 22-25 July 1974
Imprint Pagination
p. 227-232.
Journal Issue
no. 23
Series
Institute of Physics Conference Series.

Conference

Title
International conference on lattice defects in semiconductors.
Dates
22 Jul 1974.
Place
Freiburg, F.R. Germany.

INIS

Country of Publication
United Kingdom
Country of Input or Organization
United Kingdom
INIS RN
6216220
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CRYSTAL DEFECTS; ELECTRON BEAMS; NEUTRON BEAMS; PHYSICAL RADIATION EFFECTS; PROTON BEAMS; SEMICONDUCTOR MATERIALS; SILICON
Descriptors DEC
BEAMS; CRYSTAL STRUCTURE; ELEMENTS; LEPTON BEAMS; NUCLEON BEAMS; PARTICLE BEAMS; RADIATION EFFECTS; SEMIMETALS