Published 2008 | Version v1
Journal article

Dislocation related defect states in GaN irradiated with 1 MeV electron-beam

  • 1. Quantum-Function Spinics Lab., Department of Physics, Hanyang University, Seoul 133-791 (Korea, Republic of)
  • 2. Seoul Center, Korea Basic Science Institute, Seoul 133-701 (Korea, Republic of)
  • 3. Nano Device Research Center, Korea Institute of Science and Technology, Seoul 130-701 (Korea, Republic of)

Description

Undoped GaN layers with thickness of 278 μm were grown by hydride vapor phase epitaxy method. The samples with different threading dislocation densities of 9.0 x 106 cm-2 and 7.2x106 cm-2 were irradiated by electron-beam with the energy of 1 MeV and dose of 1 x 1015 cm-2. The defect states of the samples after electron beam irradiation were characterized by deep level transient spectroscopy measurement. After the electron-beam irradiation, the the defects appeared to states with the activation energies of 0.61 eV, 0.30 eV, and 0.57 eV. (copyright 2008 WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim) (orig.)

Availability note (English)

Available from: http://dx.doi.org/10.1002/pssc.200778552

Additional details

Identifiers

Publishing Information

Journal Title
Physica Status Solidi. C, Conferences
Journal Volume
5
Journal Issue
6
Journal Page Range
p. 1630-1632
ISSN
1610-1634

Conference

Title
7. international conference of nitride semiconductors (ICNS-7)
Dates
16-21 Sep 2007
Place
Las Vegas, NV (United States)

Optional Information

Notes
With 3 figs., 11 refs.. SICI: 1610-1634(200805)5:6<1630::AID-PSSC200778552>3.0.TX;2-1