Published September 1993 | Version v1
Journal article

Dry radiation-chemical etching of metallic bismuth and aluminum films

Description

The authors have developed radiation-sensitive charge-transfer-complex-based polymer materials which on irradiation form intermediate particles and compounds that enable etching of bismuth and aluminum metals. Metallic films, deposited on a substrate and coated with a radiation-sensitive material, were subjected to etching. Under electron irradiation with D = 0.8 and 640 Gy in a regime with and without optical enhancement of the latent image the optical density of the Bi film decreased from 1.4 to 0.7. The maximum achieved sensitivity for an Al film corresponds to a decrease of optical density from 4 to 2 under irradiation with D ∼ 600 Gy

Additional details

Publishing Information

Journal Title
High Energy Chemistry
Journal Volume
27
Journal Issue
2
Journal Page Range
p. 109-114.
ISSN
0018-1439
CODEN
HIECAP

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
25038987
Subject category
S38: RADIATION CHEMISTRY, RADIOCHEMISTRY AND NUCLEAR CHEMISTRY; S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Translation
Descriptors DEI
ALUMINIUM; BISMUTH; CHEMICAL RADIATION EFFECTS; ELECTRON BEAMS; ETCHING
Descriptors DEC
BEAMS; ELEMENTS; LEPTON BEAMS; METALS; PARTICLE BEAMS; RADIATION EFFECTS

Optional Information

Notes
Cover-to-cover Translation of Khimiya Vysokikh Energii (USSR); Translated from Khimiya Energii; 27: No. 2, 25-31(Mar-Apr 1993).