Published February 2010 | Version v1
Journal article

Demonstration of ultra-high-resolution MFM images using Co90Fe10-coated CNT probes

  • 1. Device Architecture Laboratory, Semiconductor R and D center, Samsung Electronics Co. Ltd., Yongin 446-712 (Korea, Republic of)
  • 2. AE group, Corporate Technology Operations SAIT, Samsung Electronics Co. Ltd., Yongin 446-712 (Korea, Republic of)
  • 3. Magnetic Device Group, Corporate Technology Operations SAIT, Samsung Electronics Co. Ltd., Yongin 446-712 (Korea, Republic of)
  • 4. Department of Physics, College of Science and Technology, Yonsei University, Wonju 220-710 (Korea, Republic of)
  • 5. Department of Material Science and Engineering, POSTECH, Pohang 790-784 (Korea, Republic of)
  • 6. Department of Materials Science and Engineering, Korea University, Seoul 136-701 (Korea, Republic of)

Description

We demonstrate ultra-high-resolution magnetic force microscopy images of perpendicular magnetic storage media using carbon nanotube probes coated by ferromagnetic Co90Fe10 films (20, 30, 40, and 50 nm). By optimizing ferromagnetic film thickness (effective tip diameter), we obtained best magnetic domain image with an 40 nm-Co90Fe10-coated tip (50 nm tip diameter) about a lateral detect density of 1200 k flux per inch on perpendicular magnetic storage medium, one of the highest resolutions in MFM imaging reported for this material system and structure. The observed dependence of tip dimension on signal contrast and image resolution was successfully explained by a theoretical analysis indicating that the signal contrast, along with the physical probe-tip dimension, should be taken into account to design magnetic probes tips for high-resolution magnetic force microscopy.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.jmmm.2009.09.052

Additional details

Identifiers

DOI
10.1016/j.jmmm.2009.09.052;
PII
S0304-8853(09)00949-4;

Publishing Information

Journal Title
Journal of Magnetism and Magnetic Materials
Journal Volume
322
Journal Issue
3
Journal Page Range
p. 332-336
ISSN
0304-8853
CODEN
JMMMDC

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41088934
Subject category
S77: NANOSCIENCE AND NANOTECHNOLOGY;
Descriptors DEI
ATOMIC FORCE MICROSCOPY; CARBON; DENSITY; DESIGN; FILMS; IMAGES; MAGNETIC FIELDS; MAGNETIC PROBES; MAGNETIZATION; NANOTUBES; OPTIMIZATION; RESOLUTION; SIGNALS; STORAGE; THICKNESS
Descriptors DEC
DIMENSIONS; ELEMENTS; MICROSCOPY; NANOSTRUCTURES; NONMETALS; PHYSICAL PROPERTIES; PROBES

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.