Published May 1986
| Version v1
Journal article
Evaluation of thick target PIXE analyses with a minicomputer
Description
Thick target particle-induced x-ray emission (TTPIXE) spectrometry has been increasingly used for multielement and trace element analyses. The theoretical background and a formalism are presented for their evaluation by means of a minicomputer. Numerical results are given and compared with the experimental ones. The advantage of the program is shown by a special experimental example. (author)
Additional details
Publishing Information
- Journal Title
- J. Radioanal. Nucl. Chem.
- Journal Volume
- 99
- Journal Issue
- 1
- Series
- J. Radioanal. Nucl. Chem. ;Articles.
- Journal Page Range
- 193-202
- ISSN
- 0236-5731
- CODEN
- JRNCD
INIS
- Country of Publication
- Hungary
- Country of Input or Organization
- Hungary
- INIS RN
- 17053831
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- COMPUTER CALCULATIONS; CORRECTIONS; GALLIUM ARSENIDES; GALLIUM PHOSPHIDES; INTEGRAL EQUATIONS; K SHELL; MULTI-ELEMENT ANALYSIS; PIXE ANALYSIS; STOPPING POWER; TRACE AMOUNTS
- Descriptors DEC
- ARSENIC COMPOUNDS; ARSENIDES; CHEMICAL ANALYSIS; ELECTRONIC STRUCTURE; EQUATIONS; GALLIUM COMPOUNDS; NONDESTRUCTIVE ANALYSIS; PHOSPHIDES; PHOSPHORUS COMPOUNDS; X-RAY EMISSION ANALYSIS
Optional Information
- Notes
- 12 refs.; 5 figs.