Published January 1999
| Version v1
Journal article
Measurements of laser-hole boring into overdense plasmas using x-ray laser refractometry (invited)
Creators
- 1. Institute of Laser Engineering (ILE), Osaka University, Suita, Osaka 565 (Japan)
- 2. DMP, ONRI, Ikeda, Osaka 563 (Japan)
- 3. Lawrence Livermore National Laboratory, University of California, Livermore, California 94550 (United States)
Description
We developed a 19.6 nm laser x-ray laser grid-image refractometer (XRL-GIR) to diagnose laser-hole boring into overdense plasmas. The XRL-GIR was optimized to measure two-dimensional electron density perturbation on a scale of a few tens of μm in underdense plasmas. Electron density profiles of laser-produced plasmas were obtained for 1020 - 1022cm-3 with the XRL-GIR and for 1019 - 1020cm-3 from an ultraviolet interferometer, the profiles of which were compared with those from hydrodynamic simulation. By using this XRL-GIR, we directly observed laser channeling into overdense plasmas accompanied by a bow shock wave showing a Mach cone ascribed to supersonic propagation of the channel front. copyright 1999 American Institute of Physics
Additional details
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 70
- Journal Issue
- 1
- Journal Page Range
- p. 543-548
- ISSN
- 0034-6748
- CODEN
- RSINAK
Conference
- Title
- 12. topical conference on high-temperature plasma diagnostics
- Dates
- 7-11 Jun 1998
- Place
- Princeton, NJ (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 30011089
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ELECTRON DENSITY; HYDRODYNAMICS; INTERFEROMETERS; PLASMA DENSITY; PLASMA DIAGNOSTICS; PLASMA SIMULATION; REFRACTIVE INDEX; SHOCK WAVES; X RADIATION
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; FLUID MECHANICS; IONIZING RADIATIONS; MEASURING INSTRUMENTS; MECHANICS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RADIATIONS; SIMULATION
Optional Information
- Secondary number(s)
- CONF-980605--