Published January 1999 | Version v1
Journal article

Measurements of laser-hole boring into overdense plasmas using x-ray laser refractometry (invited)

  • 1. Institute of Laser Engineering (ILE), Osaka University, Suita, Osaka 565 (Japan)
  • 2. DMP, ONRI, Ikeda, Osaka 563 (Japan)
  • 3. Lawrence Livermore National Laboratory, University of California, Livermore, California 94550 (United States)

Description

We developed a 19.6 nm laser x-ray laser grid-image refractometer (XRL-GIR) to diagnose laser-hole boring into overdense plasmas. The XRL-GIR was optimized to measure two-dimensional electron density perturbation on a scale of a few tens of μm in underdense plasmas. Electron density profiles of laser-produced plasmas were obtained for 1020 - 1022cm-3 with the XRL-GIR and for 1019 - 1020cm-3 from an ultraviolet interferometer, the profiles of which were compared with those from hydrodynamic simulation. By using this XRL-GIR, we directly observed laser channeling into overdense plasmas accompanied by a bow shock wave showing a Mach cone ascribed to supersonic propagation of the channel front. copyright 1999 American Institute of Physics

Additional details

Publishing Information

Journal Title
Review of Scientific Instruments
Journal Volume
70
Journal Issue
1
Journal Page Range
p. 543-548
ISSN
0034-6748
CODEN
RSINAK

Conference

Title
12. topical conference on high-temperature plasma diagnostics
Dates
7-11 Jun 1998
Place
Princeton, NJ (United States)

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
30011089
Subject category
S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ELECTRON DENSITY; HYDRODYNAMICS; INTERFEROMETERS; PLASMA DENSITY; PLASMA DIAGNOSTICS; PLASMA SIMULATION; REFRACTIVE INDEX; SHOCK WAVES; X RADIATION
Descriptors DEC
ELECTROMAGNETIC RADIATION; FLUID MECHANICS; IONIZING RADIATIONS; MEASURING INSTRUMENTS; MECHANICS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RADIATIONS; SIMULATION

Optional Information

Secondary number(s)
CONF-980605--