Published May 1992
| Version v1
Report
X-ray spectroscopy of high-z ions
Description
X-ray spectroscopy is a tool of choice for studying the properties of high-Z ions and provides valuable data to test atomic models, excitation cross section and atomic structure calculations. Measurements are presented of highly charged heliumlike and neonlike ions from tokamak observations and the electron beam ion trap at Livermore which illustrate unresolved questions of atomic physics and state-of-the-art approaches to address the issues
Additional details
Publishing Information
- Imprint Title
- EBIT: Electron beam ion trap
- Imprint Pagination
- 308 p.
- Journal Page Range
- p. 133-143.
- Report number
- UCRL-ID--110491
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 24052093
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Descriptors DEI
- CHROMIUM IONS; CROSS SECTIONS; DIAGNOSTIC TECHNIQUES; EXCITATION; IRON IONS; LANTHANUM IONS; MULTICHARGED IONS; SCANDIUM IONS; SILVER IONS; TITANIUM IONS; TRAPS; X-RAY SPECTROSCOPY; XENON IONS; YTTERBIUM IONS
- Descriptors DEC
- CHARGED PARTICLES; ENERGY-LEVEL TRANSITIONS; IONS; SPECTROSCOPY
Optional Information
- Contract/Grant/Project number
- Contract W-7405-ENG-48