Direct imaging of asymmetric magnetization reversal in exchange-biased Fe/MnPd bilayers by X-ray photoemission electron microscopy
- 1. Stanford Synchrotron Radiation Laboratory, Stanford University, Stanford, California 94025 (United States)
- 2. Materials Science and Engineering, University of Washington, Seattle, Washington 98195 (United States)
Description
X-ray photoemission electron microscopy is used to probe the remnant magnetic domain structure in high quality, single-crystalline, exchange-biased Fe/MnPd bilayers. It is found that the induced unidirectional anisotropy strongly affects the overall magnetic domain structure. Real space images of the ferromagnetic domains provide direct evidence for an asymmetric magnetization reversal process after saturation along the ferromagnetic hard direction. The magnetization reversal occurs by moment rotation for decreasing fields while it proceeds by domain nucleation and growth for increasing fields. The observed domains are consistent with the crystallography of the bilayers and favor a configuration that minimizes the overall magnetostatic energy of the ferromagnetic layer
Additional details
Identifiers
Publishing Information
- Journal Title
- Physical Review Letters
- Journal Volume
- 94
- Journal Issue
- 10
- Journal Page Range
- p. 107203-107203.4
- ISSN
- 0031-9007
- CODEN
- PRLTAO
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36071308
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANISOTROPY; ASYMMETRY; BINARY ALLOY SYSTEMS; CRYSTAL GROWTH; CRYSTALLOGRAPHY; DOMAIN STRUCTURE; ELECTRON MICROSCOPY; ELECTRONS; EXCHANGE INTERACTIONS; FERROMAGNETIC MATERIALS; IRON; LAYERS; MAGNETISM; MAGNETIZATION; MANGANESE ALLOYS; MONOCRYSTALS; PALLADIUM ALLOYS; PHOTOEMISSION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- ALLOY SYSTEMS; ALLOYS; CRYSTALS; ELECTRON SPECTROSCOPY; ELEMENTARY PARTICLES; ELEMENTS; EMISSION; FERMIONS; INTERACTIONS; LEPTONS; MAGNETIC MATERIALS; MATERIALS; METALS; MICROSCOPY; PHOTOELECTRON SPECTROSCOPY; PLATINUM METAL ALLOYS; SECONDARY EMISSION; SPECTROSCOPY; TRANSITION ELEMENT ALLOYS; TRANSITION ELEMENTS
Optional Information
- Notes
- (c) 2005 The American Physical Society