Published May 2006 | Version v1
Journal article

Operation of transition-edge sensors with excess thermal noise

  • 1. Nanoscience Center, Department of Physics, University of Jyvaeskylae, PO Box 35, FIN-40014 (Finland)
  • 2. VTT Millilab, PO Box 1202, FIN-02044 VTT (Finland)

Description

The superconducting transition-edge sensor (TES) is currently one of the most attractive choices for ultra-high resolution calorimetry in the keV x-ray band, and is being considered for future ESA and NASA missions. We have performed a study on the noise characteristics of Au/Ti bilayer TESs, at operating temperatures around ∼100 mK, with the SQUID readout at 1.5 K. Experimental results indicate that without modifications the back-action noise from the SQUID chip degrades the noise characteristics significantly. We present a simple and effective solution to the problem: by installing an extra shunt resistor which absorbs the excess radiation from the SQUID input, we have reduced the excess thermal (photon) noise power down by approximately a factor of five, allowing high resolution operation of the sensors

Availability note (English)

Available online at http://stacks.iop.org/0953-2048/19/S242/sust6_5_S16.pdf or at the Web site for the journal Superconductor Science and Technology (ISSN 1361-6668) http://www.iop.org/

Additional details

Publishing Information

Journal Title
Superconductor Science and Technology
Journal Volume
19
Journal Issue
5
Journal Page Range
p. S242-S245
ISSN
0953-2048
CODEN
SUSTEF

Conference

Title
10. international superconductive electronics conference
Acronym
ISEC 2005
Dates
5-9 Sep 2005
Place
Noordwijkerhout (Netherlands)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37085140
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CALORIMETRY; GOLD; LAYERS; NOISE; RESISTORS; SQUID DEVICES; TITANIUM
Descriptors DEC
ELECTRICAL EQUIPMENT; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; FLUXMETERS; MEASURING INSTRUMENTS; METALS; MICROWAVE EQUIPMENT; SUPERCONDUCTING DEVICES; TRANSITION ELEMENTS