High resistivity ZnSe coated substrates for microstrip gas chambers
Creators
- 1. Spire Corp., Bedford, MA (United States)
- 2. Lawrence Berkeley National Lab., CA (United States). Physics Div.
- 3. Carleton Univ., Ottawa, Ontario (Canada). Centre for Research in Particle Physics
Description
Microstrip gas chambers (MSGCs) require substrates with sheet resistance in the range of 1013--1016 ohms/square to eliminate polarization and surface charging effects between the electrodes. Thin films of II-VI semiconductors deposited on glass or plastic substrates are attractive for this application since bulk resistivity of these semiconductors vary in the range 109--1012 ohm-cm and films with good uniformity can be deposited over large-areas using inexpensive deposition techniques. In this paper, deposition, characterization, and fabrication of MSGCs using ZnSe thin films are reported for the first time. ZnSe thin films were deposited on glass and plastic substrates by thermal evaporation. Sheet resistance of ZnSe varied in the range of 1015 to 1016 ohms/square depending on the deposition conditions. A MSGC detector fabricated using a 0.5 microm thick ZnSe layer on glass substrate exhibited best values; gas gain of 25,000 and an energy resolution of about 16.7% FWHM at a gain of 1,080 for a 55Fe source
Additional details
Publishing Information
- Journal Title
- IEEE Transactions on Nuclear Science
- Journal Volume
- 45
- Journal Issue
- 3Pt1
- Journal Page Range
- p. 285-289
- ISSN
- 0018-9499
- CODEN
- IETNAE
Conference
- Title
- Institute of Electrical and Electronic Engineers (IEEE) nuclear science symposium and medical imaging conference
- Dates
- 11-13 Nov 1997
- Place
- Albuquerque, NM (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 29048201
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CHARGED PARTICLE DETECTION; COATINGS; ELECTRIC CONDUCTIVITY; GAS TRACK DETECTORS; PROPORTIONAL COUNTERS; SUBSTRATES; X-RAY DETECTION; ZINC SELENIDES
- Descriptors DEC
- CHALCOGENIDES; DETECTION; ELECTRICAL PROPERTIES; MEASURING INSTRUMENTS; PHYSICAL PROPERTIES; RADIATION DETECTION; RADIATION DETECTORS; SELENIDES; SELENIUM COMPOUNDS; ZINC COMPOUNDS
Optional Information
- Funding organization
- USDOE, Washington, DC (United States)
- Secondary number(s)
- CONF-971147--