Published June 1998 | Version v1
Journal article

High resistivity ZnSe coated substrates for microstrip gas chambers

  • 1. Spire Corp., Bedford, MA (United States)
  • 2. Lawrence Berkeley National Lab., CA (United States). Physics Div.
  • 3. Carleton Univ., Ottawa, Ontario (Canada). Centre for Research in Particle Physics

Description

Microstrip gas chambers (MSGCs) require substrates with sheet resistance in the range of 1013--1016 ohms/square to eliminate polarization and surface charging effects between the electrodes. Thin films of II-VI semiconductors deposited on glass or plastic substrates are attractive for this application since bulk resistivity of these semiconductors vary in the range 109--1012 ohm-cm and films with good uniformity can be deposited over large-areas using inexpensive deposition techniques. In this paper, deposition, characterization, and fabrication of MSGCs using ZnSe thin films are reported for the first time. ZnSe thin films were deposited on glass and plastic substrates by thermal evaporation. Sheet resistance of ZnSe varied in the range of 1015 to 1016 ohms/square depending on the deposition conditions. A MSGC detector fabricated using a 0.5 microm thick ZnSe layer on glass substrate exhibited best values; gas gain of 25,000 and an energy resolution of about 16.7% FWHM at a gain of 1,080 for a 55Fe source

Additional details

Publishing Information

Journal Title
IEEE Transactions on Nuclear Science
Journal Volume
45
Journal Issue
3Pt1
Journal Page Range
p. 285-289
ISSN
0018-9499
CODEN
IETNAE

Conference

Title
Institute of Electrical and Electronic Engineers (IEEE) nuclear science symposium and medical imaging conference
Dates
11-13 Nov 1997
Place
Albuquerque, NM (United States)

Optional Information

Funding organization
USDOE, Washington, DC (United States)
Secondary number(s)
CONF-971147--