Radiation effects in Ag1-xTlxInSe2 single crystals

Full text: Information about electrical and photoelectric properties of AgInSe2 single crystals will be found in the literature. However, X-ray conductivity of AgInSe2 and (Ag↔Tl) solid solutions on their base has been remained quite unstudied. The present paper deals with experimental results relative to X-ray conductivity and X-ray dosimetric characteristics of AgInSe2 crystals and solid solutions Ag1-xTlxInSe2 (x=0-0.015) at 300 K. Mentioned single crystals are grown by Bridgman-Stockbarger method. Indium contacts serve as measuring electrodes. Installation URS-55a was the source of radiation. X-ray radiation (E) dose falling on the crystals are measured by crystalline X-ray dosimeter DRGZ-02. The value of X-ray conductivity coefficient Kσ characterising X-ray sensitivity is defined. experiments showed that X-ray current function ΔJE,0 on E is following: ΔJE,O≅Eα. Averaged values of α decreased from 1.0 up to 0.5 as 'effective hardness' grow from 25 up to 50 keV. Comparing X-ray dosimetric characteristics of AgInSe2 and Ag1-xTlxInSe2 crystals notes that because of partial substitution Ag ions by Tl ions there have been distinct increase of Kσ. One of the advantage of Ag1-xTlxInSe2 crystals as the sensitive elements of crystalline X-ray detectors of corresponding dosimeter is the linearity (α≅1) of their X-ray ampere characteristics in the range of comparatively 'soft' radiation