Published April 4, 2007 | Version v1
Journal article

The effect of low temperature annealing on the structure of Gd5Si2Ge2 alloy

  • 1. Department of Applied Physics, University of Electronic Science and Technology of China, Chengdu 610054 (China)
  • 2. Department of Applied Physics, University of Electronic Science and Technology of China, Chengdu 610054 (China) and International Center for Material Physics, Chinese Academy of Sciences, Shengyang 110015 (China)
  • 3. Materials Science and Technology Division, Mail Stop G755, Los Alamos National Laboratory, Los Alamos, NM 87545 (United States)

Description

Heat treatments at 150 and 400 oC for different times were employed on the powdered and bulk Gd5Si2Ge2 alloy. The phase composition and transformations were characterized by X-ray powder diffraction (XRD) and differential scanning calorimetry (DSC). The powdered Gd5Si2Ge2 samples, which were heat-treated at 150 oC for 2 h and at 400 oC for 0.5 h, change from Gd5Si2Ge2-type structure to Gd5Si2Ge2-type and Gd5Si4-type double-phase structure. However, there is no change in the structure on the bulk Gd5Si2Ge2 samples heat-treated at 400 oC for 0.5 and 10 h. These results indicate that the inner stresses can induce the Gd5Si2Ge2 β-γ phase transformation to occur at lower temperatures

Additional details

Identifiers

DOI
10.1016/j.jallcom.2006.05.053;
PII
S0925-8388(06)00551-2;

Publishing Information

Journal Title
Journal of Alloys and Compounds
Journal Volume
431
Journal Issue
1-2
Journal Page Range
p. 89-92
ISSN
0925-8388
CODEN
JALCEU

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
39013294
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ANNEALING; CALORIMETRY; GADOLINIUM ALLOYS; GERMANIUM ALLOYS; PHASE TRANSFORMATIONS; SILICON ALLOYS; STRESSES; TEMPERATURE RANGE 0273-0400 K; TEMPERATURE RANGE 0400-1000 K; X-RAY DIFFRACTION
Descriptors DEC
ALLOYS; COHERENT SCATTERING; DIFFRACTION; HEAT TREATMENTS; RARE EARTH ALLOYS; SCATTERING; TEMPERATURE RANGE

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.