Published September 1, 2009 | Version v1
Journal article Metadata-only

Image enhancement of x-ray microscope using frequency spectrum analysis

Creators

  • 1. National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei, Anhui 230029 (China)
  • 2. Institute of High Energy Physics, Chinese Academy of Science, Beijing 100049 (China)

Description

We demonstrate a new method for x-ray microscope image enhancement using frequency spectrum analysis. Fine sample characteristics are well enhanced with homogeneous visibility and better contrast from single image. This method is easy to implement and really helps to improve the quality of image taken by our imaging system.

Availability note (English)

Available from http://dx.doi.org/10.1088/1742-6596/186/1/012009

Additional details

Identifiers

DOI
10.1088/1742-6596/186/1/012009;

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
186
Journal Issue
1
Journal Page Range
[3 p.]
ISSN
1742-6596

Conference

Title
9. international conference on X-ray microscopy
Dates
21-25 Jul 2008
Place
Zurich (Switzerland)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
42027428
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
FREQUENCY ANALYSIS; IMAGE PROCESSING; IMAGES; MICROSCOPES; VISIBILITY; X RADIATION
Descriptors DEC
ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; PROCESSING; RADIATIONS