Production and characterization of hard films of ZrN with temperature variations
Creators
- 1. Universidad Nacional de Colombia Sede Manizales, Km. 9 via al aeropuerto Campus La Nubia, Manizales (Colombia)
Description
ZrN films were grown by the PAPVD method in the pulsed arc technique; bilayers were grown on stainless steel substrates by using a repetitive pulsed vacuum arc system. To produce the coatings, a target of Zr with a purity of 99.99% was used. The system is composed by a reaction chamber with two opposite electrodes placed inside it. The target is the cathode and the samples of stainless steel are the anode. A pulsed power supply is used to generate the discharge. The coatings were grown, varying the temperature of the substrate between 50 C and 260 C. The pressure into chamber was 3 mbar and the voltage of the discharge was 270 V. XRD technique was employed to study the coatings, observing changes on the lattice paramenter and intensity variations of the crystallographic planes, as a function of the substrate temperature. Morphological characteristics were analized by means of an Atomic Force Microscopy (AFM), determining the thickness and the grain size. (copyright 2005 WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim) (orig.)
Availability note (English)
Available from: http://dx.doi.org/10.1002/pssc.200461750Additional details
Identifiers
Publishing Information
- Journal Title
- Physica Status Solidi. C, Conferences
- Journal Volume
- 2
- Journal Issue
- 10
- Journal Page Range
- p. 3702-3705
- ISSN
- 1610-1634
Conference
- Title
- 17. Latinamerican symposium of solid state physics
- Original Conference Title
- SLAFES 2004: 17. simposio latinoamericano de fisica del estado solido
- Acronym
- SLAFES 2004
- Dates
- 6-9 Dec 2004
- Place
- La Habana (Cuba)
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 36103976
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; ELECTRIC ARCS; GRAIN SIZE; LATTICE PARAMETERS; LAYERS; MORPHOLOGY; PHYSICAL VAPOR DEPOSITION; PRESSURE RANGE PA; PULSE TECHNIQUES; STAINLESS STEELS; SUBSTRATES; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE 0273-0400 K; TEMPERATURE RANGE 0400-1000 K; THICKNESS; THIN FILMS; X-RAY DIFFRACTION; ZIRCONIUM NITRIDES
- Descriptors DEC
- ALLOYS; CARBON ADDITIONS; COHERENT SCATTERING; CURRENTS; DEPOSITION; DIFFRACTION; DIMENSIONS; ELECTRIC CURRENTS; ELECTRIC DISCHARGES; FILMS; HIGH ALLOY STEELS; IRON ALLOYS; IRON BASE ALLOYS; MICROSCOPY; MICROSTRUCTURE; NITRIDES; NITROGEN COMPOUNDS; PNICTIDES; PRESSURE RANGE; SCATTERING; SIZE; STEELS; SURFACE COATING; TEMPERATURE RANGE; TRANSITION ELEMENT ALLOYS; TRANSITION ELEMENT COMPOUNDS; ZIRCONIUM COMPOUNDS
Optional Information
- Notes
- With 2 figs., 1 tab., 17 refs.. SICI: 1610-1634(200508)2:10<3702::AID-PSSC200461750>3.0.TX;2-N