Published 2018 | Version v1
Journal article

Bayesian Integrated Data Analysis of Fast-Ion Measurements by Velocity-Space Tomography

  • 1. Univ Milano Bicocca, Dept Phys, Milan (Italy)
  • 2. Tech Univ Denmark, Dept Phys, Lyngby (Denmark)
  • 3. CNR, Ist Fis Plasma, Milan (Italy)
  • 4. Max Planck Inst Plasma Phys, Garching (Germany)
  • 5. Uppsala Univ, Dept Phys and Astron, Uppsala (Sweden)
  • 6. Rutherford Appleton Lab, Sci and Technol Facil Council, ISIS Facil, Didcot, Oxon (United Kingdom)
  • 7. CCFE, Culham Sci Ctr, Abingdon, Oxon (United Kingdom)
  • 8. NERSC, Lawrence Berkeley Natl Lab, Berkeley, CA (United States)
  • 9. Aalto Univ, Dept Appl Phys, Aalto (Finland)
  • 10. Max Planck Inst Plasma Phys, Greifswald (Germany)

Description

Bayesian integrated data analysis combines measurements from different diagnostics to jointly measure plasma parameters of interest such as temperatures, densities, and drift velocities. Integrated data analysis of fast-ion measurements has long been hampered by the complexity of the strongly non-Maxwellian fast-ion distribution functions. This has recently been overcome by velocity-space tomography. In this method two-dimensional images of the velocity distribution functions consisting of a few hundreds or thousands of pixels are reconstructed using the available fast-ion measurements. Here we present an overview and current status of this emerging technique at the ASDEX Upgrade tokamak and the JET tokamak based on fast-ion D-alpha spectroscopy, collective Thomson scattering, gamma-ray and neutron emission spectrometry, and neutral particle analyzers. We discuss Tikhonov regularization within the Bayesian framework. The implementation for different types of diagnostics as well as the uncertainties are discussed, and we highlight the importance of integrated data analysis of all available detectors. (authors)

Availability note (English)

Available from doi: http://dx.doi.org/10.1080/15361055.2017.1380482

Additional details

Publishing Information

Journal Title
Fusion Science and Technology
Journal Volume
74
Journal Issue
no.1-2
Journal Page Range
p. 23-36
ISSN
1536-1055