Effects of the lateral ordering of self-assembled SiGe nanoislands grown on strained Si1−xGex buffer layers
Creators
- 1. National Academy of Sciences of Ukraine, V. Lashkaryov Institute of Semiconductor Physics (Ukraine)
- 2. Russian Academy of Sciences, Institute for Physics of Microstructures (Russian Federation)
Description
Atomic-force microscopy, micro-Raman spectroscopy, and high resolution X-ray diffraction are applied to study the spatial ordering in single layers of SiGe nanoislands grown on a strained Si1−xGex buffer sublayer. It is shown that, apart from stimulating the spatial ordering of nanoislands, the introduction of a Si1−xGex sublayer leads to an enhanced role for interdiffusion processes. An unusually high increase in the volume of nanoislands in the process of the epitaxy is related to the anomalously strong diffusion from the buffer sublayer into the islands that is induced by nonuniform fields of elastic strains. The anisotropy of the islands shape and spatial ordering is discussed in terms of the anisotropy of the diffusion processes in spatially nonuniform fields of elastic strains.
Additional details
Identifiers
Publishing Information
- Journal Title
- Semiconductors
- Journal Volume
- 46
- Journal Issue
- 5
- Journal Page Range
- p. 647-654
- ISSN
- 1063-7826
- CODEN
- SMICES
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43129359
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANISOTROPY; ATOMIC FORCE MICROSCOPY; BUFFERS; DIFFUSION; EPITAXY; GERMANIUM SILICIDES; LAYERS; RAMAN SPECTROSCOPY; SHAPE; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; CRYSTAL GROWTH METHODS; DIFFRACTION; GERMANIUM COMPOUNDS; LASER SPECTROSCOPY; MICROSCOPY; SCATTERING; SILICIDES; SILICON COMPOUNDS; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2012 Pleiades Publishing, Ltd.