Published May 2012 | Version v1
Journal article

Effects of the lateral ordering of self-assembled SiGe nanoislands grown on strained Si1−xGex buffer layers

  • 1. National Academy of Sciences of Ukraine, V. Lashkaryov Institute of Semiconductor Physics (Ukraine)
  • 2. Russian Academy of Sciences, Institute for Physics of Microstructures (Russian Federation)

Description

Atomic-force microscopy, micro-Raman spectroscopy, and high resolution X-ray diffraction are applied to study the spatial ordering in single layers of SiGe nanoislands grown on a strained Si1−xGex buffer sublayer. It is shown that, apart from stimulating the spatial ordering of nanoislands, the introduction of a Si1−xGex sublayer leads to an enhanced role for interdiffusion processes. An unusually high increase in the volume of nanoislands in the process of the epitaxy is related to the anomalously strong diffusion from the buffer sublayer into the islands that is induced by nonuniform fields of elastic strains. The anisotropy of the islands shape and spatial ordering is discussed in terms of the anisotropy of the diffusion processes in spatially nonuniform fields of elastic strains.

Additional details

Identifiers

Publishing Information

Journal Title
Semiconductors
Journal Volume
46
Journal Issue
5
Journal Page Range
p. 647-654
ISSN
1063-7826
CODEN
SMICES

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43129359
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ANISOTROPY; ATOMIC FORCE MICROSCOPY; BUFFERS; DIFFUSION; EPITAXY; GERMANIUM SILICIDES; LAYERS; RAMAN SPECTROSCOPY; SHAPE; X-RAY DIFFRACTION
Descriptors DEC
COHERENT SCATTERING; CRYSTAL GROWTH METHODS; DIFFRACTION; GERMANIUM COMPOUNDS; LASER SPECTROSCOPY; MICROSCOPY; SCATTERING; SILICIDES; SILICON COMPOUNDS; SPECTROSCOPY

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Copyright
Copyright (c) 2012 Pleiades Publishing, Ltd.