Low-energy foil aberration corrector
Creators
Description
A spherical and chromatic aberration corrector for electron microscopes is proposed, consisting of a thin foil sandwiched between two apertures. The electrons are retarded at the foil to almost zero energy, so that they can travel ballistically through the foil. It is shown that such a low-voltage corrector has a negative spherical aberration for not too large distances between aperture and foil, as well as a negative chromatic aberration. For various distances the third- and fifth-order spherical aberration coefficients and the first- and second-order chromatic aberration coefficients are calculated using ray tracing. Provided that the foils have sufficient electron transmission the corrector is able to correct the third-order spherical aberration and the first-order chromatic aberration of a typical low-voltage scanning electron microscope. Preliminary results show that the fifth-order spherical aberration and the second-order chromatic aberration can be kept sufficiently low
Additional details
Identifiers
- PII
- S0304399102002875;
Publishing Information
- Journal Title
- Ultramicroscopy (Amsterdam)
- Journal Volume
- 93
- Journal Issue
- 3-4
- Journal Page Range
- p. 321-330
- ISSN
- 0304-3991
- CODEN
- ULTRD6
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37036585
- Subject category
- S72: PHYSICS OF ELEMENTARY PARTICLES AND FIELDS;
- Descriptors DEI
- APERTURES; CHROMATIC ABERRATIONS; DISTANCE; ELECTRIC POTENTIAL; ELECTRON MICROSCOPES; ELECTRONS; FOILS; GEOMETRICAL ABERRATIONS; SCANNING ELECTRON MICROSCOPY; SPHERICAL CONFIGURATION
- Descriptors DEC
- CONFIGURATION; ELECTRON MICROSCOPY; ELEMENTARY PARTICLES; FERMIONS; LEPTONS; MICROSCOPES; MICROSCOPY; OPENINGS
Optional Information
- Copyright
- Copyright (c) 2002 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.