Quantitative trace element analysis with sub-micron lateral resolution
- 1. Nukleare Festkoerperphysik, Universitaet Leipzig, Linnestr. 5, D-04103 Leipzig (Germany)
- 2. Paul-Flechsig-Institut fuer Hirnforschung, Universitaet Leipzig, Jahnallee 59, 04109 Leipzig (Germany)
Description
In recent years many nuclear microprobes have developed to sophisticated tools for elemental analysis with high resolutions down to about 1 μm micron. The application to trace element analysis is mainly in the field of biological and medical research. Numerous successful studies on microscopic scale structures, e.g. cells, lead to the demand for higher spatial resolution or lower detection limits. Therefore, several labs started new efforts for sub-micron resolutions, sometimes intending 100 nm. The Leipzig microprobe laboratory LIPSION has recently improved its analytical capabilities. We are now able to perform quantitative trace element analysis with sub-micron spatial resolution (beam diameter 0.5 μm at 120 pA). As an example we give the trace element distribution in neuromelanin (intracellular pigment of neurons). Furthermore, when the scan size is reduced from cellular level, i.e. about 50 μm, to sub-cellular level of about 10 μm, the beam diameter can further be reduced by choosing smaller object diaphragms. The unavoidable reduction in beam current will not affect the mapping sensitivity unless the accumulated charge per spatial resolution is not decreased. The smallest beam diameter with analytical capabilities for elemental analysis we achieved thus far was about 300 nm in diameter. It enables an outstanding microPIXE resolution. However, some difficulties appeared in high-resolution work, which limited the acquisition time to less than 30 min
Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2006.03.129;
- PII
- S0168-583X(06)00364-8;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 249
- Journal Issue
- 1-2
- Journal Page Range
- p. 734-737
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 17. international conference on ion beam analysis
- Dates
- 26 Jun - 1 Jul 2005
- Place
- Sevilla (Spain)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38035605
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BEAM CURRENTS; BEAMS; DISTRIBUTION; MAPPING; NERVE CELLS; PIGMENTS; PIXE ANALYSIS; SENSITIVITY; SPATIAL RESOLUTION
- Descriptors DEC
- ANIMAL CELLS; CHEMICAL ANALYSIS; CURRENTS; NONDESTRUCTIVE ANALYSIS; RESOLUTION; SOMATIC CELLS; X-RAY EMISSION ANALYSIS
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.