Published August 2006 | Version v1
Journal article

Quantitative trace element analysis with sub-micron lateral resolution

  • 1. Nukleare Festkoerperphysik, Universitaet Leipzig, Linnestr. 5, D-04103 Leipzig (Germany)
  • 2. Paul-Flechsig-Institut fuer Hirnforschung, Universitaet Leipzig, Jahnallee 59, 04109 Leipzig (Germany)

Description

In recent years many nuclear microprobes have developed to sophisticated tools for elemental analysis with high resolutions down to about 1 μm micron. The application to trace element analysis is mainly in the field of biological and medical research. Numerous successful studies on microscopic scale structures, e.g. cells, lead to the demand for higher spatial resolution or lower detection limits. Therefore, several labs started new efforts for sub-micron resolutions, sometimes intending 100 nm. The Leipzig microprobe laboratory LIPSION has recently improved its analytical capabilities. We are now able to perform quantitative trace element analysis with sub-micron spatial resolution (beam diameter 0.5 μm at 120 pA). As an example we give the trace element distribution in neuromelanin (intracellular pigment of neurons). Furthermore, when the scan size is reduced from cellular level, i.e. about 50 μm, to sub-cellular level of about 10 μm, the beam diameter can further be reduced by choosing smaller object diaphragms. The unavoidable reduction in beam current will not affect the mapping sensitivity unless the accumulated charge per spatial resolution is not decreased. The smallest beam diameter with analytical capabilities for elemental analysis we achieved thus far was about 300 nm in diameter. It enables an outstanding microPIXE resolution. However, some difficulties appeared in high-resolution work, which limited the acquisition time to less than 30 min

Additional details

Identifiers

DOI
10.1016/j.nimb.2006.03.129;
PII
S0168-583X(06)00364-8;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
249
Journal Issue
1-2
Journal Page Range
p. 734-737
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
17. international conference on ion beam analysis
Dates
26 Jun - 1 Jul 2005
Place
Sevilla (Spain)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38035605
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BEAM CURRENTS; BEAMS; DISTRIBUTION; MAPPING; NERVE CELLS; PIGMENTS; PIXE ANALYSIS; SENSITIVITY; SPATIAL RESOLUTION
Descriptors DEC
ANIMAL CELLS; CHEMICAL ANALYSIS; CURRENTS; NONDESTRUCTIVE ANALYSIS; RESOLUTION; SOMATIC CELLS; X-RAY EMISSION ANALYSIS

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.