The effect of Sr doping on structural and dielectric properties of Ba2Co2Fe12O22 ceramics
Creators
- 1. Huazhong University of Science and Technology, School of Physics (China)
- 2. Xinyang Normal University, School of Physics and Electronic Engineering (China)
Description
Polycrystalline Ba2−xSrxCo2Fe12O22 (0 ≤ x≤0.5) ceramics have been synthesized by the conventional solid-state-reaction method. From the analysis of X-ray diffraction and scanning electron microscopy, it can be obtained that the lattice parameters decrease monotonically with the increase in Sr doping content, while the average grain size presents a complicated trend. The dielectric measurements show that dielectric constants of all samples are larger than 103 over a wide range of temperature and frequency (300–650 K and 1 kHz–1 MHz), which is identified as colossal dielectric constant. However, with the rise in Sr doping content, disparate evolutions of dielectric constant are found at 300 K and 600 K. A detailed study of dielectric response, impedance spectra and conductivity analysis suggest that the variation of dielectric constant at 300 K is dominated by the activation energy of relaxation, while that at 600 K is mainly in connection with the average grain size.
Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Materials Science. Materials in Electronics
- Journal Volume
- 30
- Journal Issue
- 24
- Journal Page Range
- p. 21079-21088
- ISSN
- 0957-4522
- CODEN
- JSMEEV
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52023576
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; S36: MATERIALS SCIENCE;
- Descriptors DEI
- ACTIVATION ENERGY; CERAMICS; DIELECTRIC MATERIALS; DIELECTRIC PROPERTIES; DOPED MATERIALS; GRAIN SIZE; LATTICE PARAMETERS; SCANNING ELECTRON MICROSCOPY; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; ENERGY; MATERIALS; MICROSCOPY; MICROSTRUCTURE; PHYSICAL PROPERTIES; SCATTERING; SIZE
Optional Information
- Copyright
- Copyright (c) 2019 Springer Science+Business Media, LLC, part of Springer Nature