Published May 15, 2010 | Version v1
Journal article

The growth and stability of Fe layers on the Mo(1 1 1) surface

  • 1. Institute of Experimental Physics, University of Wroclaw, pl. M. Borna 9, 50-204 Wroclaw (Poland)

Description

The initial growth and the stability of Fe layers on the Mo(1 1 1) surface was studied with Auger electron spectroscopy, low energy electron diffraction, scanning tunneling microscopy and thermal desorption spectroscopy. At room temperature at least the first two monolayers grow layer-by-layer. The first layer is stable up to about 1200 K. Excess Fe starts to agglomerate at about 400 K and forms with increasing temperature thick flat-top islands which start to sublime at a somewhat below 1200 K. A strong decrease of the adsorption energy with coverage was found in the first monolayer. No {2 1 1} or { 1 1 0} micro-faceting could be seen at any coverage upon annealing.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.apsusc.2010.01.107

Additional details

Identifiers

DOI
10.1016/j.apsusc.2010.01.107;
PII
S0169-4332(10)00145-5;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
256
Journal Issue
15
Journal Page Range
p. 4801-4805
ISSN
0169-4332
CODEN
ASUSEE

Conference

Title
4. international workshop on surface physics 'surfaces and nanostructures'
Dates
20-25 Sep 2009
Place
Ladek-Zdroj (Poland)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44019954
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ADSORPTION; ANNEALING; AUGER ELECTRON SPECTROSCOPY; ELECTRON DIFFRACTION; IRON; LAYERS; MOLYBDENUM; SCANNING TUNNELING MICROSCOPY; STABILITY; SURFACES; TEMPERATURE RANGE 0273-0400 K
Descriptors DEC
COHERENT SCATTERING; DIFFRACTION; ELECTRON SPECTROSCOPY; ELEMENTS; HEAT TREATMENTS; METALS; MICROSCOPY; REFRACTORY METALS; SCATTERING; SORPTION; SPECTROSCOPY; TEMPERATURE RANGE; TRANSITION ELEMENTS

Optional Information

Copyright
Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.