Published May 15, 2010
| Version v1
Journal article
The growth and stability of Fe layers on the Mo(1 1 1) surface
Creators
- 1. Institute of Experimental Physics, University of Wroclaw, pl. M. Borna 9, 50-204 Wroclaw (Poland)
Description
The initial growth and the stability of Fe layers on the Mo(1 1 1) surface was studied with Auger electron spectroscopy, low energy electron diffraction, scanning tunneling microscopy and thermal desorption spectroscopy. At room temperature at least the first two monolayers grow layer-by-layer. The first layer is stable up to about 1200 K. Excess Fe starts to agglomerate at about 400 K and forms with increasing temperature thick flat-top islands which start to sublime at a somewhat below 1200 K. A strong decrease of the adsorption energy with coverage was found in the first monolayer. No {2 1 1} or { 1 1 0} micro-faceting could be seen at any coverage upon annealing.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2010.01.107Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2010.01.107;
- PII
- S0169-4332(10)00145-5;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 256
- Journal Issue
- 15
- Journal Page Range
- p. 4801-4805
- ISSN
- 0169-4332
- CODEN
- ASUSEE
Conference
- Title
- 4. international workshop on surface physics 'surfaces and nanostructures'
- Dates
- 20-25 Sep 2009
- Place
- Ladek-Zdroj (Poland)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44019954
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ADSORPTION; ANNEALING; AUGER ELECTRON SPECTROSCOPY; ELECTRON DIFFRACTION; IRON; LAYERS; MOLYBDENUM; SCANNING TUNNELING MICROSCOPY; STABILITY; SURFACES; TEMPERATURE RANGE 0273-0400 K
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; ELECTRON SPECTROSCOPY; ELEMENTS; HEAT TREATMENTS; METALS; MICROSCOPY; REFRACTORY METALS; SCATTERING; SORPTION; SPECTROSCOPY; TEMPERATURE RANGE; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.