Published March 3, 2010 | Version v1
Journal article

Probing surface and interface structure using optics

Creators

  • 1. School of Physics, Trinity College Dublin, Dublin 2 (Ireland)

Description

Optical techniques for probing surface and interface structure are introduced and recent developments in the field are discussed. These techniques offer significant advantages over conventional surface probes: all pressure ranges of gas-condensed matter interfaces are accessible and liquid-liquid, liquid-solid and solid-solid interfaces can be probed, due to the large penetration depth of the optical radiation. Sensitivity and discrimination from the bulk are the two challenges facing optical techniques in probing surface and interface structure. Where instrumental improvements have resulted in enhanced sensitivity, conventional optical techniques can be used to characterize heterogeneous adsorbed layers on a substrate, often with sub-monolayer resolution. Nanoscale lateral resolution is possible using scanning near-field optics. A separate class of techniques, which includes reflection anisotropy spectroscopy, and nonlinear optical probes such as second-harmonic and sum-frequency generation, uses the difference in symmetry between the bulk and the surface or interface to suppress the bulk contribution. A perspective is presented of likely future developments in this rapidly expanding field.

Availability note (English)

Available from http://dx.doi.org/10.1088/0953-8984/22/8/084018

Additional details

Identifiers

DOI
10.1088/0953-8984/22/8/084018;
PII
S0953-8984(10)17470-0;

Publishing Information

Journal Title
Journal of Physics. Condensed Matter
Journal Volume
22
Journal Issue
8
Journal Page Range
[16 p.]
ISSN
0953-8984
CODEN
JCOMEL

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41110701
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
ANISOTROPY; INTERFACES; LAYERS; LIQUIDS; NANOSTRUCTURES; NONLINEAR PROBLEMS; OPTICAL PROPERTIES; OPTICS; PENETRATION DEPTH; PRESSURE RANGE; PROBES; REFLECTION; RESOLUTION; SENSITIVITY; SOLIDS; SPECTROSCOPY; SUBSTRATES; SURFACE PROPERTIES; SURFACES; SYMMETRY
Descriptors DEC
FLUIDS; PHYSICAL PROPERTIES