A flexible LabVIEWTM-based data acquisition and analysis system for scanning microscopy
Description
A new data analysis system has been developed with computer-controlled beam and sample positioning, video sample imaging, multiple large solid angle detectors for X-rays and gamma-rays, and surface barrier detectors for charged particles. The system uses the LabVIEWTM programming language allowing it to be easily ported between different computer operating systems. In the present configuration, digital signal processors are directly interfaced to a SCSI CAMAC controller. However, the modular software design permits the substitution of other hardware with LabVIEW-supported drivers. On-line displays of histogram and two-dimensional elemental map images provide a user-friendly data acquisition interface. Subregions of the two-dimensional maps may be selected interactively for detailed analysis or for subsequent scanning. Off-line data processing of archived data currently yields elemental maps, analyzed spectra and reconstructions of tomographic data
Additional details
Identifiers
- PII
- S0168583X99005078;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 158
- Journal Issue
- 1-4
- Journal Page Range
- p. 146-152
- ISSN
- 0168-583X
- CODEN
- NIMBEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 33028803
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- BEAM POSITION; CAMAC SYSTEM; COMPUTERIZED CONTROL SYSTEMS; DATA ACQUISITION SYSTEMS; EQUIPMENT INTERFACES; IMAGE PROCESSING; SCANNING ELECTRON MICROSCOPY
- Descriptors DEC
- CONTROL SYSTEMS; ELECTRON MICROSCOPY; MICROSCOPY; ON-LINE CONTROL SYSTEMS; ON-LINE SYSTEMS; PROCESSING
Optional Information
- Copyright
- Copyright (c) 1999 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.