Published April 15, 2015
| Version v1
Journal article
Electric field effect on texture formation of mullite in spark plasma sintered SiC with Al2O3–SiO2 additive
- 1. Secure Materials Center, Materials and Structures Laboratory, Tokyo Institute of Technology, Yokohama, Kanagawa 226-8503 (Japan)
- 2. Faculty of Pure and Applied Science, University of Tsukuba, 1-1-1, Tennodai, Ibaraki 305-8573 (Japan)
- 3. Research Laboratory for Nuclear Reactors, Tokyo Institute of Technology, 2-12-1, Ookayama, Meguro-ku, Tokyo 152-8550 (Japan)
Description
Nanocrystalline SiC ceramics were sintered by spark plasma sintering, with alumina and quartz powders as additives. X-ray diffraction and transmission electron microscopy analyses revealed that mullite phase with the preferred orientation of the c-axis perpendicular to the compressive axis was formed in SiC ceramics sintered at 1600 and 1700 °C, while mullite phase with the preferred orientation of the c-axis parallel to the current direction was formed in SiC ceramics sintered at 1800 and 1900 °C
Availability note (English)
Available from http://dx.doi.org/10.1016/j.scriptamat.2014.12.011Additional details
Identifiers
- DOI
- 10.1016/j.scriptamat.2014.12.011;
- PII
- S1359-6462(14)00532-6;
Publishing Information
- Journal Title
- Scripta Materialia
- Journal Volume
- 100
- Journal Page Range
- p. 51-54
- ISSN
- 1359-6462
- CODEN
- SCMAF7
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47041150
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ADDITIVES; ALUMINIUM OXIDES; CERAMICS; CRYSTALS; ELECTRIC FIELDS; GRAIN ORIENTATION; MULLITE; NANOSTRUCTURES; PLASMA; POWDERS; QUARTZ; SILICON CARBIDES; SILICON OXIDES; SINTERING; TEMPERATURE DEPENDENCE; TEXTURE; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION
- Descriptors DEC
- ALUMINIUM COMPOUNDS; CARBIDES; CARBON COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; FABRICATION; INORGANIC ION EXCHANGERS; ION EXCHANGE MATERIALS; MATERIALS; MICROSCOPY; MICROSTRUCTURE; MINERALS; ORIENTATION; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; SCATTERING; SILICON COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.