A quantitative assessment of carbon nanotube dispersion in polymer matrices
- 1. Advanced Materials and Processing Branch, NASA Langley Research Center, 6 West Taylor Street, Hampton, VA 23681 (United States)
- 2. National Institute of Aerospace, 100 Exploration Way, Hampton, VA 23666 (United States)
- 3. Department of Mechanical Engineering, Virginia Polytechnic Institute and State University, 100 Randolph Hall, Blacksburg, VA 24061 (United States)
Description
Quantifying the nature and extent of the dispersion of nanomaterials in polymer matrices is the important first step in understanding the relationship between the nanoscale structure and the bulk scale functional performance of nanocomposites. We present here a methodology for using scanning electron microscope images of nanocomposites taken under high accelerating voltages to quantify four parameters that relate to the dispersion of the nanomaterial. This image analysis methodology is general and applicable to images from other microscopes as well. The analysis performed here was done on representative local areas of six samples to determine the effects of processing conditions, matrix chemistry, and carbon nanotube composition on the level of dispersion. Future work will involve expanding this analysis to rapidly cover larger areas and reducing the data in a manner that is similar to the approach of small angle scattering studies.
Availability note (English)
Available from http://dx.doi.org/10.1088/0957-4484/20/32/325708Additional details
Identifiers
- DOI
- 10.1088/0957-4484/20/32/325708;
- PII
- S0957-4484(09)02997-3;
Publishing Information
- Journal Title
- Nanotechnology (Print)
- Journal Volume
- 20
- Journal Issue
- 32
- Journal Page Range
- [7 p.]
- ISSN
- 0957-4484
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42071565
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- CARBON; COMPOSITE MATERIALS; DISPERSIONS; NANOTUBES; PERFORMANCE; POLYMERS; SCANNING ELECTRON MICROSCOPY; SMALL ANGLE SCATTERING
- Descriptors DEC
- ELECTRON MICROSCOPY; ELEMENTS; MATERIALS; MICROSCOPY; NANOSTRUCTURES; NONMETALS; SCATTERING