Gradient-based and wavelet-based compressed sensing approaches for highly undersampled tomographic datasets
Creators
- 1. Univ. Grenoble Alpes, CEA, LETI, Grenoble F-38000 (France)
- 2. Univ. Paris Saclay, CEA-NeuroSpin, INRIA, Parietal, Gif-sur-Yvette, F-91191 (France)
- 3. Dipartimento di Fisica, Cittadella Universitaria di Monserrato, Università degli Studi di Cagliari, S.P. 8 km 0.700, 09042, Monserrato (Italy)
- 4. Univ. Grenoble Alpes, CEA, IRIG, Grenoble F-38000 (France)
Description
Highlights: • Comparison between TV-based and wavelet-based compressed sensing methods. • Higher-order TV and biorthogonal wavelets outperform the classical TV approach. • These approaches produce high quality spectroscopic reconstructions. • An open-source Python package is provided with both approaches. Electron tomography is widely employed for the 3D morphological characterization at the nanoscale. In recent years, there has been a growing interest in analytical electron tomography (AET) as it is capable of providing 3D information about the elemental composition, chemical bonding and optical/electronic properties of nanomaterials. AET requires advanced reconstruction algorithms as the datasets often consist of a very limited number of projections. Total variation (TV)-based compressed sensing approaches were shown to provide high-quality reconstructions from undersampled datasets, but staircasing artefacts can appear when the assumption about piecewise constancy does not hold. In this paper, we compare higher-order TV and wavelet-based approaches for AET applications and provide an open-source Python toolbox, Pyetomo, containing 2D and 3D implementations of both methods. A highly sampled STEM-HAADF dataset of an Er-doped porous Si sample and a heavily undersampled STEM-EELS dataset of a Ge-rich GeSbTe (GST) thin film annealed at 450°C are used to evaluate the performance of the different approaches. We show that polynomial annihilation with order 3 (HOTV3) and the Bior4.4 wavelet outperform the classical TV minimization and the related Haar wavelet.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.ultramic.2021.113289Additional details
Identifiers
- DOI
- 10.1016/j.ultramic.2021.113289;
- PII
- S0304399121000772;
Publishing Information
- Journal Title
- Ultramicroscopy (Amsterdam)
- Journal Volume
- 225
- Journal Page Range
- vp.
- ISSN
- 0304-3991
- CODEN
- ULTRD6
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 54112341
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S97: MATHEMATICAL METHODS AND COMPUTING;
- Descriptors DEI
- ALGORITHMS; ANNIHILATION; CHEMICAL BONDS; DOPED MATERIALS; ELECTRONS; NANOMATERIALS; NANOSTRUCTURES; PERFORMANCE; POLYNOMIALS; POROUS MATERIALS; PYTHON; THIN FILMS; TOMOGRAPHY
- Descriptors DEC
- DIAGNOSTIC TECHNIQUES; ELEMENTARY PARTICLES; FERMIONS; FILMS; FUNCTIONS; INTERACTIONS; LEPTONS; MATERIALS; MATHEMATICAL LOGIC; PARTICLE INTERACTIONS; PROGRAMMING LANGUAGES
Optional Information
- Copyright
- Copyright (c) 2021 Elsevier B.V. All rights reserved.